Understanding of surface structure and topography is essential for interpretation of material behavior at the nanoscale. To measure nano surfaces, different methods can be used such as confocal microscopy, scanning electron microscopy, transmission electron microscopy, and scanning probe microscopy (SPM). Atomic force microscopy (AFM) is a member in the SPM family that can measure various properties of samples in conjunction with their surface morphology. AFM allows quantitative measurement of surface features as small as angstrom level, which is relatively difficult to observe in conventional optical-based or electron beam-based techniques. To collect an AFM image, a sharp tip is typically used to sense the sample surface, and information on surface characteristics is accumulated by monitoring the tip-sample atomic interactions during scanning. Depending on specific applications, the AFM tip will come into direct contact (contact mode), intermittently contact (tapping mode), or scan over the sample surface at a given distance (non-contact mode). Contact, tapping, and non-contact are fundamental imaging modes of AFM. On the basics of these modes, various advanced techniques have been developed to measure different properties of samples such as electrical properties (C-AFM, KPFM, PFM modes, etc.), mechanical properties (nanoindentation, FD spectroscopy, and PinPoint modes), magnetic (MFM mode), and thermal (SThM mode) properties. Within the scope of this webinar, practical applications of the imaging modes of AFM will be introduced. In addition, for better understanding on how AFM can measure your samples, a live session on imaging modes operations is also provided. It is expected that this webinar can be a useful material for gaining knowledge of AFM as well as its capabilities.