Check out all webinars from the Empowering AFM Imaging series here. Atomic Force Microscopes are versatile tools for academic and industrial research labs. Park Systems’ AFMs can achieve real-space images with sub-nanometer resolution over large areas. Functional properties such as electrical current, work function, piezoelectric response, and Youngs modulus can also be mapped with nanometer resolution. Although AFMs can generate excellent insightful data, setting up an AFM experiment can take up to an hour depending on complexity of the experiment. Additionally, when analyses of several functional properties are required, the user must also change the cantilever probe and possibly the hardware configuration of the instrument as well. In this webinar, I will show how these problems are solved with Park Systems’ next generation FX40 AFM. The user only loads samples and several cantilevers in the AFM at once and the rest can be controlled via the SmartScan software. I will demonstrate these powerful features of the FX40 by imaging several common types of AFM samples, using different imaging modes and cantilevers.