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Park NX12

The Most Versatile AFM for Analytical Chemistry

Park NX12 is an all-in-one solution for nanoscale microscopy. It provides high-resolution imaging with diverse property measurement capabilities. It excels in electrochemistry research and is ideal for multi-user facilities serving a wide range of research disciplines. This adaptable platform covers a range of applications, from nanomechanical mapping, scanning ion conductance microscopy to inverted optical microscopy. Its flexibility is further enhanced by optional hardware and software add-ons, making it an ideal choice for analytical researchers and multi-user facility users.

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A Versatile Microscopy Platform for Analytical Chemistry Researchers and Shared User Facilities

Our system integrates AFM for nanometer resolution imaging, offering capabilities to measure electrical, magnetic, thermal, and mechanical properties. It also includes a pipette-based scanning system for high-resolution Scanning Ion Conductance Microscopy (SICM), Scanning Electrochemical Microscopy (SECM), and Scanning Electrochemical Cell Microscopy (SECCM). Additionally, the Inverted Optical Microscopy (IOM) feature is optimized for research on transparent materials and can be integrated with fluorescence microscopy. Park NX12 was built from the ground up to accommodate the needs of multi-user facilities. Other AFM solutions lack the required versatility to address the diverse needs of users in these facilities, making it difficult to justify the equipment cost. The Park NX12, however, is built to accommodate standard ambient AFM, in-liquid SPM, optical, and nano-optical imaging, making it one of the most flexible AFMs available.

Inverted Optical Microscope for Transparent Material Research

Proven Park NX10 performance Equipped with Inverted Optical Microscopy : Park NX12 couples the versatility and accuracy of Park’s AFM with a sample stage for inverted optical microscopy. This enables the study of electrochemical properties in samples that are transparent, opaque, soft or hard.

High-resolution Pipette-based Scanning Ion Conductance Microscopy

NX12 offers a Pipette-based scanning system for high resolution Scanning Ion Conductance Microscopy (SICM), imaging ultra-soft samples.

Nano-resolution AFM Imaging with Multi-property Measurements

The Park NX12 is AFM for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement capabilities. It can serve a wide range of functions, including PinPoint™ in-liquid and nanomechanical mapping, inverted optical microscopy to locate transparent samples, SICM for imaging ultra-soft samples, and enhanced vision to improve optics for transparent samples.

A Modular Platform for Shared User Facilities

  • Multiple Applications

    The Park NX12 can serve a wide range of functions, including PinPoint™ in-liquid and nanomechanical mapping, inverted optical microscopy to locate transparent samples, SICM for imaging ultra-soft samples, and enhanced vision to improve optics for transparent samples.

    Multiple Applications

  • Comprehensive Force Spectroscopy Solution

    The Park NX12 provides a complete package for nanomechanical characterization in-liquid and in-air, making it ideal for a wide range of applications.

    Comprehensive Force Spectroscopy Solution

  • Modular

    We make it easy to modify the Park NX12 to suit the unique needs of your lab by installing optional hardware and software add-ons even after installation.

    Modular

Why the World’s Most Accurate Small Sample AFM is Also the Easiest to Use

  • Easy Tip and Sample Exchange

    The unique head design allows easy side access allowing you to easily snap new tips and samples into place by hand. The cantilever is ready for scanning without the need for any tricky laser beam alignment by using pre-aligned cantilevers mounted on to the cantilever tip holder.

    Easy Tip and Sample Exchange

  • Lightning Fast Automatic Tip Approach

    Our automatic tip-to-sample approach requires no user intervention. By monitoring the cantilever’s response to the approaching surface, Park NX12 can initiate and complete an automatic fast tip-to-sample approach within 10 seconds of the cantilever’s loading. Fast feedback by the high-speed Z-scanner and low-noise signal processing by the NX electronics controller enable quick engagement to the sample surface without any user intervention. It just works; minimal user involvement is required.

    Lightning Fast Automatic Tip Approach

  • Easy, Intuitive Laser Beam Alignment

    With our advanced pre-aligned cantilever holder, the laser beam is focused on the cantilever upon placement. Furthermore, the natural on-axis, top-down view—the only one in the industry—allows you to easily find the laser spot. Since the laser beam falls vertically onto the cantilever, you can intuitively move the laser spot along the X- and Y-axis by rotating two positioning knobs. As a result, you can easily find the laser and position it onto the position-sensitive photodiode using our operation software’s beam alignment user interface. From there, all you will need is a minor adjustment to maximize the signal prior to starting data acquisition.

    Easy, Intuitive Laser Beam Alignment

Applications

Perfect for Diverse Applications