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Image size and lateral resolution in Atomic Force Microscope (AFM) images are generally traded off against each other as the AFM records a certain number of pixels per a given scan length, as defined by the operator.

 
 
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SmartScan Program Mode Imaging

Friday, June 5, 2020

  • 3:00 pm
    (EDT)
    Boston, New York
  • 12:00 pm
    (PDT)
    San Francisco, LA
  • 8:00 pm
    (GMT)
    London
  • 9:00 pm
    (CET)
    Paris, Rome

Combining Images

150 µm by 150 µm image made by combining nine 50 µm by 50 µm images. Images were taken automatically by SmartScan Program. Feature heights around 150 nm.

Image size and lateral resolution in Atomic Force Microscope (AFM) images are generally traded off against each other as the AFM records a certain number of pixels per a given scan length, as defined by the operator. Therefore, the larger the image with the same number of pixels, the less lateral resolution is recorded. Additionally, the lateral movement of the scanner piezo limits the AFM to 100 µm images. To counter this, SmartScan™ has built in features to program the tool to take a grid of images to make a higher resolution image as a combination of multiple images, or to take larger scans than the scanner allows. This is accomplished by combining lateral stage movement with automatic approach and imaging features. This demo will highlight one of the two methods supplied with Parks SmartScan™ software.

Presented By : 
Presented By : Ben Schoenek, Park Systems Sr. Technical Service Engineer

Ben Schoenek is a Senior Technical Service Engineer for Park Systems, where he focuses on service and support of AFM systems for Park’s research user base. He received his Master’s in Physics from Auburn University, and holds a B.A. in Physics from Kenyon College.

 

 

 

Live Demo - Park Atomic Force Microscope