-
Cross-section single_layer Scanning_Thermal_Microscopy Carbon NCM BiFeO3 MagneticArray Bismuth Multiferroic_materials Polystyrene HACrystal silicon_oxide SAM HanyangUniv IVSpectroscopy Plug Materials Defect OpticalElement Pvdf Praseodymium Co/Cr/Pt SetpointMode SelfAssembly light_emission TyphimuriumBiofilm polyvinyl acetate Fe_film PolyvinylideneFluoride StrontiuTitanate Biology NiFe PinPointMode Celebration NCM\
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
HOPG
Scanning Conditions
- System : FX40
- Scan Mode: Sideband, AM KPFM
- Scan Rate : 0.55 Hz
- Scan Size : 10μm×10μm
- Pixel Size : 256×256
- Cantilever : NSC36 Cr-Au C (k=0.6N/m, f=65kHz)