-
Jason BiFeO3 Sio2 Hole Hafnium_dioxide StrontiuTitanate Indium_tin_oxide ImideMonomer PolycrystallineFerroelectricBCZT norganic Phase AdhesionForce AtomicSteps Gallium_Arsenide MechanicalProperty pulsed_laser_deposition Thermal DOE AdhesionEnergy Ram DentalProsthesis CancerCell CeNSE_IISc Flake IISCBangalore Croatia Mechanical&nanotechnology cross section mono_layer MBE Conductivity Conducting pinpoint mode HOPG PDMS
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Lithography on compact disk
Scanning Conditions
- System: NX10
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256