-
ReflexLens Self-assembledMonolayer Electical&Electronics Sio2 OpticalModulator Conducting MBE Magnets Mapping I-VSpectroscopy HighAspect Chromium contact WWafer Reduction Epoxy Fe_film gallium_nitride StyreneBeads Modulus Defects AM_KPFM GalliumPhosphide LiIonBattery Workfunction HardDiskMedia PolymerBlend Ptfe Filter CrAu Conductance Temasek_Lab Mechanical CP-AFM Inorganic_Compound
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
BTO
Scanning Conditions
- System: XE7
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac