-
Alloy FAFailureAnlaysis Film BariumTitanate AlkaneFilm Filter Phenanthrene bias_mode dielectric trench temperature_control Forevision MLCC Sapphire GaN MonoLayer SiWafer thermal_property HDD GaP ScanningIon-ConductanceMicroscopy ShenYang SmalScan NCM\ nanomechanical Calcium ChemicalCompound Conductive AFM ConductiveAFM light_emitting CNT StrontiuTitanate mfm_amplitude Crystal SRAM MoirePattern
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
2L-MoS₂ (2/3)
Scanning Conditions
- System : FX40
- Sample bias: 0.5 V
- Scan Mode: C-AFM, LFM
- Scan Rate : 12 Hz
- Scan Size : 1μm×1μm
- Pixel Size : 512×512
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)