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Growth Copper hard_disk_media MESA structure CrAu Polydimethylsiloxane BloodCell Vanadate WWafer TemperatureControllerStage PolycrystallineFerroelectricBCZT 3-hexylthiophene Polarization CeNSE_IISc Friction LogAmplifier CeramicCapacitor KelvinProbeForceMicroscopy ScanningThermalMicroscopy InsulatorFilm BiVO4 NTU Chemical_Vapor_Deposition PiezoelectricForceMicroscopy Change MoirePattern Al2O3 aluminum_nitride Polytetrafluoroethylene semifluorinated_alkane Protein Carbon SiWafer ThermalProperties LiquidImaging
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Phthalocyanine praseodymium
Scanning Conditions
- System: NX10
- Scan Mode: EFM
- Cantilever: PPP-EFM (k=2.8 N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.3Hz
- Pixel: 1024×256