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AFM experts provide you ONLINE courses, easy and comfortable to join from home! FREE access for you to all content: Webinars, Live Demos, Educational Videos, Software Operation, NanoScientific Talk! Microscopy research has never been so easy before!

Upcoming Webinar

Advanced Piezoresponse Force Microscopy - optimizing PFM for your applications from off resonance to frequency tracking

Wednesday, 10 June 2020 /11:00 am – 12:30 pm CEST

In this webinar, we provide an overview and introduction of three available PFM modes: Off-resonance single frequency PFM, resonance-enhanced single frequency PFM and dual frequency resonance tracking (DFRT) PFM.

Photovoltaic effect in ferroelectric materials (by using Piezoresponse Force Microscopy PFM)

Wednesday, 17 June 2020 / 11:00 am – 12:30 pm CST

In this talk, thin films of epitaxially grown BiFeO3 and Pb(Zr,Ti)O3 will be used to demonstrate the photoelectrical response from ferroelectric materials.

3D Printing: Testing for Mechanical Properties

Friday, June 19, 2020 / 9:00 am PDT

This is the third webinar in our 2020 Material Science Research and AFM Webinar Series, designed to help researchers understand leading edge developments in Materials Science Research and Applications using Atomic Force Microscopy.

Electrochemical AFM (EC-AFM): Copper Deposition/Dissolution on Gold

Wednesday, May 27, 2020 / 9:00 am – 10:00 am PDT

This webinar explains the basics of EC-AFM and investigation of localized electrochemical deposition and dissolution of copper using the Park NX12 AFM System.

Advances in Scanning Capacitance Microscopy for Electrical Nanocharacterization and Failure Analysis

Wednesday, May 27, 2020 / 11:00 am CEST

In this webinar, we provide an overview and introduction into SCM using a Park Systems NX20 AFM. Furthermore, we will explore the additional options that can be added to traditional SCM using our SmartScan™ Software for improving measurement results and repeatability.

Advances in AFM: Beyond Imaging(Spanish/español)

Friday, May 22, 2020 / 10:00 AM CDT

La microscopía de sonda local (SPM) es una de las herramientas más versátiles para la visualización y caracterización de micro y nano sistemas.

4D Printing and Stimuli Response

Friday, May 22, 2020 / 9:00 am – 10:00 am PDT

This is the third webinar in our 2020 Material Science Research and AFM Webinar Series, designed to help researchers understand leading edge developments in Materials Science Research and Applications using Atomic Force Microscopy.

Live Demo

SmartScan SICM Imaging

Friday, May 29, 2020 / 12:00 pm PDT

This session will demonstrate this technique and focus on Approach Retract Scanning (ARS) to image with a pipette using Park Systems AFM.

SmartScan Lithography

Friday, May 22, 2020 / 12:00 pm PDT

In this session, we will demonstrate how to create nanometer sized structures and discuss the main parameters to consider during the process using SmartScan™ Nanolithography on the Park NX10 AFM system.

SmartScan SCM Imaging

Friday, May 15, 2020 / 12:00 pm PDT

This session will demonstrate how to acquire the doping profile for a sample by using Park Systems’ SCM module. The basic principle, instrumentation set-up, and data analysis will be covered.

Full-automation AFM in-line capabilities with the NX-Wafer

Wednesday, 6 May 2020 / 16 pm CEST

In this LIVE DEMO on the NX-Wafer Automated AFM we will introduce you to the inline metrology capabilities which are needed for full-automatic quality control.

SmartScan MFM Imaging

Friday, May 1, 2020 / 12:00 pm PDT

Magnetic force microscopy (MFM) is a Park Systems advanced AFM mode used for studying surfaces with magnetic properties by detecting the interaction between a magnetized cantilever and the sample surface.

SmartScan Advanced KPFM Imaging

Friday, April 24, 2020 / 12:00 pm PDT

In this Live Demo we will walk you through the quick automation set-up for research applications by using SmartScan & StepScan.

Webinar Recordings

Nanotechnology in Plastics and Packaging

The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Nanotechnology in Plastics and Packaging.

Surface Plasmon Resonance Spectroscopy Tandem with AFM

The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Surface Plasmon Resonance Spectroscopy Tandem with AFM.

Viscoelastic Surfactants and Oilfield Chemicals

The Park Systems 2019 Material Science Research and AFM Webinar Series continues with Viscoelastic Surfactants and Oilfield Chemicals.

Physical Properties of Emergent 2D materials with AFM

In this webinar, the reporter will share some of the experience of using Park AFM (XE 100 and NX10). Since 2011, the reporter has used Park AFM as the main research tool, and made some interesting researches in the study of 2D material properties, the characterization of optoelectronic devices, and the exploration of novel 2D material electronic devices.

2D Nanomaterials for Smart Coatings and Fluids

2-D nanomaterials are known for its property of being only one or two atoms thick. Due to their high ratio of surface area to volume, they immensely benefit from unique physical, chemical, and biological functionality.

Electrochemical Capacitors: Fundamentals, Materials, and Advanced Characterization

This webinar is the first of a two-part webinar series focused on ECs. The first webinar is focused on the fundamental of charge storage in ECs and recent advances in the development of materials for these devices.

Nanostructured Polymer Brushes With AFM

The Park Systems 2019 Material Science Research and AFM Webinar Series kicks off with Nanostructured Polymer Brushes With AFM, focusing on how Atomic Force Microscopy is a vital tool in characterizing the morphology of grafted polymer brushes.

Educational Webinars “AFM Techniques”

Atomic Force Microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping – Cantilever Modulus and Applied Force

The applications staff of Park Systems will give this webinar on atomic force microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping, specifically, we will look at the influence of cantilever stiffness and applied force on the measured modulus.

PinPoint Piezoelectric Force Microscopy

PFM functions by engaging a sample surface with a sharp conductive SPM probe. This probe's tip then has an alternating current (AC) bias applied to it in order to cause a deformation of the sample surface by way of a piezoelectric force.

Electrochemical Atomic Force Microscopy (EC-AFM)

In EC-AFM, users typically perform voltamemetry and corrosion experiments using an electrochemistry cell and a choice of potentiostat or galvanostat depending on the electrochemical application of interest.

PinPoint Nanomechanical Imaging Using Probes of Various Cantilever Stiffness

PinPoint Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion force are acquired simultaneously in real-time.

Scanning Ion Conductance Microscopy (SICM) and Scanning Electrochemical Microscopy (SECM)

SICM uses the increase of access resistance in a nanopipette placed in an electrolyte solution and monitors the ionic current flowing in and out of this probe—a flow that is hindered as the tip closes in on a sample surface.

NanoScientific Talks

Topic Speaker
Nanomechanics & Electrical Characterization
External Energy Assisted Nanomachining Using Soft AFM Probes Dr. Jia Deng, Binghamton University - SUNY, NSS US 2019
Atomic Force Microscopies to study Electronic Properties and Strain in Thin Films for Flexible Electronics Tobias Cramer, University of Bologna, Italy I NSFE 2018
The growth of organic ultra-thin films on silicon oxides with variable vacancy states: a Scanning Force Microscopy approach Cristiano Albonetti, CRN – ISMN, Italy I NSFE 2018
Detection of Hydrophobic Interactions on Rough Surfaces via Atomic Force Microscopy: from Measurement to Modelling Urs Peuker, TU Bergakademie Freiberg, Germany NSFE 2018
AFM Methodology
Chemical Sensitivity for Scanning Probe Microscopy Lukas Eng, Tech. University Dresden I NSFE 2018
Electrochemical measurements of single nanoparticles Kim McKelvey, Trinity College Dublin I NSFE 2019
Learning in Fundamental Atomistic Processes Using Suspended Silicon Nanowires Dr. Ye Tao, Rowland Institute at Harvard I NSS US 2018
3D Nanoscaffold Cantilevers for Potential Applications in High Speed Wafer Scale Imaging Hoa Le, The Rowland Institute at Harvard, NSS US 2019
Scanning Capacitance Spectroscopy for Dopant Analysis on Nanoscale Semiconductor Devices Phil Kaszuba, Global Foundries US I NSS US 2019
Measuring Ions and Electrons with Nanoscale Pipettes Dr. Lane Baker, Indiana University, NSS U 2019
Life Science and Biotechnology
Revisiting the Early Aggregation of Amyloids by AFM Single Molecule Statistical Analysis Francesco S. Ruggeri, University of Cambridge I NSFE 2018
Probing the Intersection of Nanotechnology and Biology Dr. Nathaniel Cady, Colleges of Nanoscale Science & Engineering I NSS US 2019
Metallo-DNA molecules as a tool for nanoscience and nanotechnology Miguel A. Galindo, CIC, University of Granada I NSFE 2019
AFM Applications in biology and medicine Malgorzata Lekka, Institute of Nuclear Physics, Poland I NSFE 2019
Organic Interfaces and Semiconductors
Measurement Challenges arising from New Semiconductor Materials and Structures for Integrated Circuits Dr. Alain Diebold, SUNY Polytechnic Institute I NSS US 2019
Characterizing photoelectric and ferroelectric properties of materials with scanning probe microscope Akash Bhatnagar, Centre for Innovation Competence SiLi-nano I NSFE 2019
SPM Study of Tribo-Photovaltaic Effect in Metal, Semiconductor Moving Contacts Jun Liu, University at Buffalo I NSS US 2019

ONLINE NanoAcademy - Park Atomic Force Microscope