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AFM experts provide you ONLINE courses, easy and comfortable to join from home! FREE access for you to all content: Webinars, Live Demos, Educational Videos, Software Operation, NanoScientific Talk! Microscopy research has never been so easy before!

Upcoming Webinar

Nailing down Teflon Molecules : High Resolution AFM imaging for Polymer Science - 12 November, 2020

Thursday, November 12, 2020/11:00 am (CEST)


In this webinar, we will demonstrate how atomic force microscopy (AFM) can be used to acquire ultra-high-resolution images of individual PTFE-molecules on the semi-crystalline surface of commercial Teflon tape.

PinPointing Polymers: Nanomechanical Characterization of Functional Polymer Blends - 3 December, 2020

Thursday, 3 December, 2020 /11:00 am (CEST)


In this webinar, we will describe and demonstrate polymer characterization using PinPointTM mapping on Park System’s NX10 atomic force microscope.

二维材料界面结构与性质的原子力探针显微学研究(2)- 力学结构与性质

2020年11月5日*星期四 / 北京时间东八区上午11:00-12:00 (CST)

本系列报告,将基于我们在原子力显微术的技术研究工作,利用多种先进原子力显微术针对二维材料的本征界面、异质界面以及材料/基底界面开展的研究工作。

Nano: High Resolution AFM imaging for Polymer Science (Joint webinar with Nano Nature)

Wednesday, Oct 28, 2020 / 10 am and 5 pm, (CEST)

In this webinar hosted by Nano Nature, guest presenter Dr. Vladimir Korolkov (Senior Application Scientist at Park Systems UK) will demonstrate how to better understand the overall structure of polymers.

利用静电力显微镜研究ZnO薄膜的耐湿热稳定性

2020年10月22日*星期四/北京时间东八区上午10:00-11:00

解决ZnO基TCO薄膜的耐湿热稳定性问题对其实际应用有重要的推动作用。本讲座以多晶ZnO基TCO薄膜的耐湿热稳定性为出发点,结合静电力力显微镜(EFM: Electrical Force microscopy)研究ZnO薄膜的晶界稳定性对耐湿热性能的影响,展示了原子力显微镜在氧化物晶界研究中的巨大潜力。

AFM option mode to monitor sample’s properties (with live demo) - October 20, 2020

Tuesday, 20 October, 2020/13:30 pm (SGT)

In this session, a variety of AFM option mode is introduced for investigating sample’s properties such as electrical, mechanical, magnetic, thermal and electrochemical properties.

导电原子力显微镜在电子器件纳米级电学测试中的应用

2020年9月24日/北京时间东八区上午9点到下午6点

导电原子力显微镜(C-AFM)是在扫描探针显微镜(SPM)基础上扩展的一种电学测试模式,它可以同时实现在纳米级对样品(比如:介质材料、量子点、电子器件)表面形貌和局部电学性质的

Better in Vacuum – boosting the characterization of 2D semiconductors via electrical AFM in high vacuum - September 3, 2020

Thursday, 3 September, 2020 / 11:00 am (CEST)

In this webinar, we will demonstrate on Park’s NX Hivac how high vacuum (10-5 Torr) significantly improves the sensitivity and the resolution of electrical AFM modes on TMDs.

二维材料界面结构与性质的原子力探针显微学研究(1)

2020年8月27日*星期四/北京时间东八区上午11:00-12:00

在之前,报告人已经针对的AFM的基础知识、基本模式以及功能化AFM探测模式进行了介绍。

Surface Potential Imaging via Sideband KPFM

Wednesday, August 26, 2020 / 6:00 pm CET

This webinar will introduce Sideband KPFM, using F14H20 as an object of study for the surface potential measurements.

Live Demo

SmartScan Program Mode Imaging

Friday, June 5, 2020 / 12:00 pm PDT

Image size and lateral resolution in Atomic Force Microscope (AFM) images are generally traded off against each other as the AFM records a certain number of pixels per a given scan length, as defined by the operator.

PinPoint™ Nanomechanical Imaging

Friday, June 12, 2020 / 12:00 pm PDT

This session will demonstrate how to acquire nanomechanical properties using Park Systems PinPoint™ Mode.

SmartScan SICM Imaging

Friday, May 29, 2020 / 12:00 pm PDT

This session will demonstrate this technique and focus on Approach Retract Scanning (ARS) to image with a pipette using Park Systems AFM.

SmartScan Lithography

Friday, May 22, 2020 / 12:00 pm PDT

Park AFM’s nanolithography is an advanced AFM technique used to pattern nanoscale shapes onto sample surfaces. In the bias-assisted or anodic oxidation method, a bias voltage is applied to the tip to generate an oxide pattern on a metallic o...

SmartScan SCM Imaging

Friday, May 15, 2020 / 12:00 pm PDT

Scanning Capacitance Microscopy (SCM) is an advanced imaging mode of Park AFM used to map various doping levels of non-uniformly doped semiconductor samples.

Full-automation AFM in-line capabilities with the NX-Wafer

Wednesday, 6 May 2020 / 16:00 pm CEST

In this LIVE DEMO on the NX-Wafer Automated AFM we will introduce you to the inline metrology capabilities which are needed for full-automatic quality control.

Webinar Recordings

Nanotechnology in Plastics and Packaging

The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Nanotechnology in Plastics and Packaging.

Surface Plasmon Resonance Spectroscopy Tandem with AFM

The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Surface Plasmon Resonance Spectroscopy Tandem with AFM.

Viscoelastic Surfactants and Oilfield Chemicals

The Park Systems 2019 Material Science Research and AFM Webinar Series continues with Viscoelastic Surfactants and Oilfield Chemicals.

Physical Properties of Emergent 2D materials with AFM

In this webinar, the reporter will share some of the experience of using Park AFM (XE 100 and NX10). Since 2011, the reporter has used Park AFM as the main research tool, and made some interesting researches in the study of 2D material properties, the characterization of optoelectronic devices, and the exploration of novel 2D material electronic devices.

2D Nanomaterials for Smart Coatings and Fluids

2-D nanomaterials are known for its property of being only one or two atoms thick. Due to their high ratio of surface area to volume, they immensely benefit from unique physical, chemical, and biological functionality.

Electrochemical Capacitors: Fundamentals, Materials, and Advanced Characterization

This webinar is the first of a two-part webinar series focused on ECs. The first webinar is focused on the fundamental of charge storage in ECs and recent advances in the development of materials for these devices.

Nanostructured Polymer Brushes With AFM

The Park Systems 2019 Material Science Research and AFM Webinar Series kicks off with Nanostructured Polymer Brushes With AFM, focusing on how Atomic Force Microscopy is a vital tool in characterizing the morphology of grafted polymer brushes.

Educational Webinars “AFM Techniques”

Atomic Force Microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping – Cantilever Modulus and Applied Force

The applications staff of Park Systems will give this webinar on atomic force microscopy PinPoint Nanomechanical Mode for Nanoscale Modulus Mapping, specifically, we will look at the influence of cantilever stiffness and applied force on the measured modulus.

PinPoint Piezoelectric Force Microscopy

PFM functions by engaging a sample surface with a sharp conductive SPM probe. This probe's tip then has an alternating current (AC) bias applied to it in order to cause a deformation of the sample surface by way of a piezoelectric force.

Electrochemical Atomic Force Microscopy (EC-AFM)

In EC-AFM, users typically perform voltamemetry and corrosion experiments using an electrochemistry cell and a choice of potentiostat or galvanostat depending on the electrochemical application of interest.

PinPoint Nanomechanical Imaging Using Probes of Various Cantilever Stiffness

PinPoint Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion force are acquired simultaneously in real-time.

Scanning Ion Conductance Microscopy (SICM) and Scanning Electrochemical Microscopy (SECM)

SICM uses the increase of access resistance in a nanopipette placed in an electrolyte solution and monitors the ionic current flowing in and out of this probe—a flow that is hindered as the tip closes in on a sample surface.

NanoScientific Talks

Topic Speaker
Nanomechanics & Electrical Characterization
External Energy Assisted Nanomachining Using Soft AFM Probes Dr. Jia Deng, Binghamton University - SUNY, NSS US 2019
Atomic Force Microscopies to study Electronic Properties and Strain in Thin Films for Flexible Electronics Tobias Cramer, University of Bologna, Italy I NSFE 2018
The growth of organic ultra-thin films on silicon oxides with variable vacancy states: a Scanning Force Microscopy approach Cristiano Albonetti, CRN – ISMN, Italy I NSFE 2018
Detection of Hydrophobic Interactions on Rough Surfaces via Atomic Force Microscopy: from Measurement to Modelling Urs Peuker, TU Bergakademie Freiberg, Germany NSFE 2018
AFM Methodology
Chemical Sensitivity for Scanning Probe Microscopy Lukas Eng, Tech. University Dresden I NSFE 2018
Electrochemical measurements of single nanoparticles Kim McKelvey, Trinity College Dublin I NSFE 2019
Learning in Fundamental Atomistic Processes Using Suspended Silicon Nanowires Dr. Ye Tao, Rowland Institute at Harvard I NSS US 2018
3D Nanoscaffold Cantilevers for Potential Applications in High Speed Wafer Scale Imaging Hoa Le, The Rowland Institute at Harvard, NSS US 2019
Scanning Capacitance Spectroscopy for Dopant Analysis on Nanoscale Semiconductor Devices Phil Kaszuba, Global Foundries US I NSS US 2019
Measuring Ions and Electrons with Nanoscale Pipettes Dr. Lane Baker, Indiana University, NSS U 2019
Life Science and Biotechnology
Revisiting the Early Aggregation of Amyloids by AFM Single Molecule Statistical Analysis Francesco S. Ruggeri, University of Cambridge I NSFE 2018
Probing the Intersection of Nanotechnology and Biology Dr. Nathaniel Cady, Colleges of Nanoscale Science & Engineering I NSS US 2019
Metallo-DNA molecules as a tool for nanoscience and nanotechnology Miguel A. Galindo, CIC, University of Granada I NSFE 2019
AFM Applications in biology and medicine Malgorzata Lekka, Institute of Nuclear Physics, Poland I NSFE 2019
Organic Interfaces and Semiconductors
Measurement Challenges arising from New Semiconductor Materials and Structures for Integrated Circuits Dr. Alain Diebold, SUNY Polytechnic Institute I NSS US 2019
Characterizing photoelectric and ferroelectric properties of materials with scanning probe microscope Akash Bhatnagar, Centre for Innovation Competence SiLi-nano I NSFE 2019
SPM Study of Tribo-Photovaltaic Effect in Metal, Semiconductor Moving Contacts Jun Liu, University at Buffalo I NSS US 2019

ONLINE NanoAcademy - Park Atomic Force Microscope