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Park AFM Modes and Techniques

Park AFM Special Modes

Scanning Thermal Microscopy (SThM)


High Spatial and Thermal Resolution Microscopy

Our SThM mode lets you easily find the local thermal conductivity of a sample by measuring heat transfer between tip and sample using a micro-fabricated probe.

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Temperature map of the Pole-Tip-Recession of an active hard disk slider
Scan size: 2µm
Using Probe: Diamond indentor probe
Imaged on a Park XE-Series using SThM Mode.

Magnetic Force Microscopy (MFM)


High Resolution and High Sensitivity Imaging of Magnetic Properties

Our MFM mode measures the magnetic variations over a sample surface by detecting the interaction between a magnetized cantilever and sample surface. The cantilever measures surface topography on the first scan, then lifts and follows either the stored surface topography (lift mode, available only in selected countries) or a constant distance (or constant height) at a fixed height above the sample surface.

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(a) Topography (b) MFM Phase

Scan size: 5µm
Using Probe: PPP-MFMR
Imaged on a Park XE-series using MFM Mode.

Tunable Magnetic Field MFM (TM-MFM)


High Resolution and High Sensitivity Imaging of Magnetic Properties

Our TM-MFM mode measures the magnetic domain distribution with respect to magnetic field change.

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Scan size: 30µm
Using Probe: PPP-MFMR
Imaged on a Park XE-series using TM-MFM Mode.

Chemical Force Microscopy (CFM)

CFM measures the chemical interactions between functionalized tips and sample to determine the chemical nature of surfaces and facilitate studies of chemical bonding enthalpy and surface energy. Tips are typically gold-coated and functionalized with R-SH thiols, R being the functional groups of interest such as -CH, -COOH, -NH, and -OH.

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Electrochemical Microscopy (EC-AFM)

In EC-AFM, STM the nanoscale structures of electrochemical reactions on the electrode surface can be observed. Users typically perform voltammetry and corrosion experiments using an electrochemistry cell and a choice of potentiostat/galvanostat depending on the electrochemical application of interest.

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Scanning Ion Conductance Microscopy (SICM)

Atomic force microscopy (AFM) is a widely applied scanning probe microscope (SPM) technique to obtain topographic features of sample surfaces in a height image on both insulating and conducting structures with a nanometer resolution.

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Park AFM Modes | Special modes