Simplifying AFM Workflows for Advanced 2D Materials Research
Université Paris-Saclay simplified complex 2D materials characterization and enabled reproducible multi-step AFM workflows with Park FX40
- Customer: Université Paris-Saclay, CNRS — Centre de Nanosciences et de Nanotechnologies (C2N), France
- Research Focus: Advanced 2D materials characterization, including graphene/hBN heterostructures and dynamically rotatable devices
- Solution: Park FX40 (Automated AFM Platform)
- Key Value: Automated probe exchange and alignment, reliable mode switching with precise return to the same region of interest, AFM-guided mechanical manipulation
The Challenge
Advanced 2D materials research often requires precise manipulation of complex heterostructures, probe or mode changes, and reliable return to the same region of interest. In a multi-user lab, these workflows must remain reproducible and accessible across experience levels.
“The ability to scan a region in a defined mode, then change the probe and reliably return to the exact same position, enables more complex and reproducible experiments that would be very difficult to achieve with a fully manual system.”
— Rebeca Ribeiro-Palau, CNRS Researcher, Université Paris-Saclay
The Solution
Park FX40 combines automated probe handling, reliable mode switching, precise AFM imaging, and contact mode manipulation to support complex 2D materials workflows.
- Automated Probe Exchange & Alignment: Streamlines probe loading, exchange, and alignment, reducing manual handling and simplifying transitions between AFM measurements.
- Reliable Mode Switching: Enables users to change probes and measurement modes while reliably returning to the same region of interest for complex, reproducible experiments.
- User-Friendly Multi-User Operation: Combines automated operation with intuitive software, lowering the barrier for new users while maintaining efficiency for experienced researchers.
- Flexible 2D Materials Characterization: Supports dynamically rotatable bilayer graphene/hBN heterostructures with AFM imaging and contact mode angular manipulation, enabling controlled studies of twist-angle-dependent electronic behavior.
The Results
The FX40 automation saves time and reduces user-related errors that can lead to tip damage or instrument issues. Reliable mode switching also enables researchers to revisit the same nanoscale region after changing probes or measurement modes.
In recent work on dynamically rotatable bilayer graphene/hBN heterostructures, the FX40 was used in contact mode to mechanically adjust the hBN handle and control angular alignment, supporting studies of angle-dependent electronic behavior.
“Overall, the FX40 stands out for its reliability and user-friendly design. These aspects are particularly important for both of our FX40s, especially the one in the clean room, where ease of use, reproducibility, and robustness are essential for maintaining high productivity across our team.”
— Rebeca Ribeiro-Palau
Key Outcomes
- Simplified workflows for users with different levels of AFM experience
- Reliable probe and mode switching with precise return to the same region of interest
- Reduced user-related errors and risk of tip damage
- Precise angular manipulation of dynamically rotatable graphene/hBN heterostructures
Related Publication
This capability is further demonstrated through peer-reviewed research from Université Paris-Saclay and CNRS, showing that rotational alignment between the two hBN layers can control anomalous gating effects in bilayer graphene/hBN heterostructures, as reported in Nature Materials. (DOI: 10.1038/s41563-026-02667-7)
About Park FX40
Park FX40 is a fully automated AFM platform designed for shared, multi-user research environments. Capabilities include automated probe exchange, auto laser alignment and tip detection, and image-guided sample navigation — enabling reliable, reproducible nanoscale characterization across users of all experience levels.
Learn more: www.parksystems.com/fx40
This case study is based on an interview with Rebeca Ribeiro-Palau, CNRS Researcher at Université Paris-Saclay. The FX40 supported advanced 2D materials characterization by enabling reliable probe and mode switching, precise return to the same region of interest, and AFM-guided mechanical manipulation, while simplifying operation in a multi-user research environment.