There are lots of techniques for characterizing the mechanical properties of sample, atomic force microscopy (AFM) has been widely used to investigate sample’s properties because it is able to measure Young’s modulus directly and quantitative measurement using force spectroscopy with contact mechanics models. From interactions between the AFM tip and the sample surface, the system collects that information and displays the output using force and distance units. In this presentation, we reviewed Park Systems’s mechanical properties measurement using AFM, with a particular emphasis on the “PinPoint nanomechanical mode”. This mode gathers topographical data at high resolution while simultaneously obtaining force-distance (FD) data at each pixel of the scan area. This allows sample surface morphology measurements while simultaneously obtaining quantitative nanomechanical properties such as modulus, adhesion, deformation, stiffness and energy dissipation.
