Real-space images of soft matter with molecular and sub-molecular resolution could provide valuable insights into the relationship between morphology and functionality of such materials, but their acquisition is problematic due to perceived limitations in atomic force microscopy (AFM).
Here we demonstrate that using a higher eigenmode imaging (HEMI) approach could provide a simple and versatile route to acquiring ultra-high resolution images with conventional AFM probes both in air and liquids. HEMI is based on exciting 2nd, 3rd or higher resonance modes of standard cantilevers. Using higher frequency greatly improves both resolving capabilities and acquisition speed as well. During this webinar, we will present a quick overview of various materials/samples that were successfully imaged down to a single molecule level using this approach.
Dr.Vladimir Korolkov
Applications Scientist and Director at Park Systems United Kingdom
Vladimir received his PhD in Chemistry from Moscow University in 2008. Then, he moved to the University of Heidelberg and specialized in X-ray photoelectron spectroscopy of thin films, following by the position at the University of Nottingham, where he discovered his passion for Scanning Probe Microscopy (SPM), and became a strong advocate of SPM techniques to unlock structure and properties at nanoscale. He pioneered the use of higher eigenmodes of standard cantilevers to routinely achieve resolution that was previously thought to be exclusively limited to STM and UHV-STM. Vladimir published more than 40 scientific papers, including three in Nature family journals. He left academia in 2018 to contribute to the industrial site of SPM technology.
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