![FX40 with monitor](/content/dam/parksystems/product/research-afm/afmmodes/thumbnail/pinpoint-nanomechanical-mode.jpg)
PinPoint™ Nanomechanical Mode
PinPoint™ Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion forces are acquired simultaneously in real-time. While the XY scanner stops, the high speed force-distance curves are taken with well-defined control of contact force and contact time between the tip and the sample. Due to controllable data acquisition time, PinPoint™ Nanomechanical mode allows optimized nanomechanical measurement with high signal-to-noise ratio over various sample surfaces.