2D Materials in Real and Reciprocal Spaces: Complimentary AFM and RHEED Studies
Speaker : Yu Xiang Affiliation : Rensselaer Polytechnic Institute Region : US Year : 2018 Language : English Explore two-dimensional materials like graphene in real and reciprocal spaces using AFM and RHEED. Understand their structures through AFM's morphology insights, wrinkle identification, and interlayer spacing determination. Complementarily, RHEED unveils symmetry, epitaxy, and crystallinity. The synergy provides a comprehensive understanding of these materials.
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