Characterizing photoelectric and ferroelectric properties of materials with scanning probe microscope
Speaker : Akash Bhatnagar Affiliation : Centre for Innovation Competence SiLi-nano Region : Europe Year : 2019 Language : English Explore the role of the bulk photovoltaic effect in probing domain walls and determining in-plane polarization in ferroelectric materials. Discover how photovoltaic current measurements reveal insights into material properties, offering a non-destructive method for characterization.
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