No compromise between Smart & Big Data analysis for AFM

Speaker : Romain Stomp Affiliation : Zürich Instruments Region : Europe Year : 2019 Language : English The lecture delves into advanced data analysis methods for atomic force microscopy (AFM), distinguishing between frequency domain and time domain approaches. It emphasizes the importance of quantitative analysis and introduces techniques such as resonance tracking, modulation, and multi-frequency analysis. These methods enable precise characterization of nanoscale interactions for various applications.

Application

AFM Exclusive

Authors

Romain Stomp

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