Symbiotic Relationship between the Atomic Force Microscope and the Scanning Electron Microscope
Speaker : Mr. John Yik Affiliation : Technical Consultant, Singapore Region : Asia Year : 2021 Language : English Explore the symbiotic relationship between Atomic Force Microscopes (AFM) and Scanning Electron Microscopes (SEM), focusing on their crucial roles in semiconductor manufacturing. Delve into defect analysis, surface characterization, and structural inspection vital for industry advancement.
