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MLCC HDD PatternedSapphireSubstrat Al2O3 contact conductive BloodCell PS_LDPE MeltingPoint LiftHeight Electical&Electronics NiFe SelfAssembly biocompatible HardDisk HafniumDioxide Workfunction InorganicCompound Typhimurium high_resolution Defects GaN SmalScan temperature controller AFM OpticalElement Chrome HexagonalBoronNitride Leakage Mosfet HexacontaneFilm Jason Dental Vacuum SmallScan AM-KPFM
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V