|고객문의  Global
Park Probe Store

당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오. 아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 이 이메일 주소가 스팸봇으로부터 보호됩니다. 확인하려면 자바스크립트 활성화가 필요합니다. 에게 문의 바랍니다.
- Nanosensors, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.

Part Num. Model / Description 한국판매가
(단위:원)
부가세 별도
  PPP-NCHR (10ea.)    
610-1051 ▪ Non-contact cantilever with high resonant frequency
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 551,000
610-0051 Unmounted Type 437,000
  SSS-NCHR (10ea.)    
610-1056 ▪ Non-contact cantilever with super sharp tip
▪ Backside reflex coating (Al)
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 1,248,000
610-0056 Unmounted Type 1,070,000
  BL-AC40TS (10ea.)    
610-1049 ▪ Probe for imaging soft samples
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Effective tip length: ~3.5 μm (total 7 μm)
▪ Typical tip radius: ~10 nm
▪ k = ~0.09 N/m, f = ~110 kHz
Mounted Type 921,000
610-0049 Unmounted Type 843,000
  OMCL-AC160TS (10ea.)    
610-1183 ▪ Non-Contact cantilever with high resonant frequency 
▪ Backside reflective coating (Al)
▪ Tip shape: Sharpened tetrahedral on zero setback position
▪ Typical tip length: ~14 μm
▪ Typical tip radius: ~7 nm
▪ k = ~26 N/m, f = ~300 kHz
Mounted Type 507,000
610-0183 Unmounted Type 429,000
  ATEC-NC (10ea.)    
610-1020 ▪ Non-contact cantilever
▪ Tip shape: Tetrahedral tip on zero setback position
▪ Typical tip length: 15 - 20 μm
▪ Typical tip radius: <10 nm
▪ k = ~45 N/m, f = ~335 kHz
Mounted Type 713,000
610-0020 Unmounted Type 636,000
  ACTA (10ea.)    
610-1201 ▪ Non-contact cantilever
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Typical tip length: 14 - 16 μm
▪ Typical tip radius: ~6 nm
▪ k = ~37 N/m, f = ~300 kHz
Mounted Type 500,000
610-0201 Unmounted Type 422,000
  PPP-NCH (10ea.)    
610-1125 ▪ Non-contact cantilever with high resonant frequency
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 591,000
610-0125 Unmounted Type 461,000
  SSS-NCH (10ea.)    
610-1081 ▪ Non-contact cantilever with super sharp tip
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 1,361,000
610-0081 Unmounted Type 1,167,000
  PPP-NCLR (10ea.)    
610-1105 ▪ Non-contact cantilever with low resonant frequency 
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 629,000
610-0105 Unmounted Type 500,000
  SSS-NCLR (10ea.)    
610-1106 ▪ Non-contact cantilever with low resonant frequency
▪ Backside reflex coating (Al)
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 1,361,000
610-0106 Unmounted Type 1,083,000
  PPP-NCL (10ea.)    
610-1095 ▪ Non-contact cantilever with low resonant frequency 
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 629,000
610-0095 Unmounted Type 500,000
  SSS-NCL (10ea.)    
610-1094 ▪ Non-contact cantilever with low resonant frequency 
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 1,248,000
610-0094 Unmounted Type 1,070,000
  NSC15/Al BS (10ea.)    
610-1011 ▪ Non-contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm
▪ k = ~40 N/m, f = ~325 kHz
Mounted Type 389,000
610-0011 Unmounted Type 312,000
  AR5-NCHR (10ea.)    
610-1055 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Backside reflex coating (Al)
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 1,569,000
610-0055 Unmounted Type 1,374,000
  AR5-NCH (10ea.)    
610-1127 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 1,418,000
610-0127 Unmounted Type 1,248,000
  AR5-NCLR (10ea.)    
610-1089 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Backside reflex coating 
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~48 N/m, f = ~190 kHz
Mounted Type 1,418,000
610-0089 Unmounted Type 1,248,000
  AR5-NCL (10ea.)    
610-1090 - Discontinued by manufacturer. AR5-NCLR (610-0089/610-1089) is recommended. Mounted Type
610-0090 Unmounted Type
  AR5T-NCHR (10ea.)    
610-1060 ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Backside reflex coating (Al)
▪ Tip tilt compensation: 13°
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 2,256,000
610-0060 Unmounted Type 2,062,000
  AR5T-NCH (10ea.)    
610-1126 - Discontinued by manufacturer. AR5T-NCHR (610-0060/610-1060) is recommended Mounted Type
610-0126 Unmounted Type
  HARTA-12-2 (5ea.)    
605-1123 ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~2 μm
▪ Typical tip radius: ~30 nm
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 2,171,000
605-0123 Unmounted Type 2,074,000
  HARTA-12-4 (5ea.)    
605-1124 ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~4 μm
▪ Typical tip radius: ~30 nm
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 2,171,000
605-0124 Unmounted Type 2,074,000
  HARTA-12-6 (5ea.)    
605-1138 ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~6 μm
▪ Typical tip radius: ~30 nm
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 2,171,000
605-0138 Unmounted Type 2,074,000
  EBD2-100A (5ea.)    
605-1132 ▪ Non-contact cantilever with high aspect ratio tip (>6:1) (HDC/DLC)
▪ Backside reflex coating 
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~2 μm
▪ Typical tip radius: <5 nm
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 2,068,000
605-0132 Unmounted Type 1,971,000
  EBD4-200A (5ea.)    
605-1139 ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC)
▪ Backside reflex coating 
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~4 μm (max.)
▪ Typical tip radius: <5 nm
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 2,068,000
605-0139 Unmounted Type 1,971,000
  EBD6-400A (5ea.)    
605-1134 ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~6 μm (max.)
▪ Typical tip radius: <5 nm
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 2,068,000
605-0134 Unmounted Type 1,971,000
  MCNT-100 (5ea.)    
605-1156 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~100 nm
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 7,290,000
605-0156 Unmounted Type 7,128,000
  MCNT-150 (5ea.)    
605-1157 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~150 nm 
▪ Typical tip radius: ~2 nm (<5 nm)
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 7,290,000
605-0157 Unmounted Type 7,128,000
  MCNT-300 (5ea.)    
605-1158 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~300 nm 
▪ Typical tip radius: ~5 nm (<7 nm)
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 6,520,000
605-0158 Unmounted Type 6,480,000
  MCNT-400 (5ea.)    
605-1159 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~400 nm
▪ Typical tip radius: ~5 nm (<7 nm)
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 6,520,000
605-0159 Unmounted Type 6,480,000
  MCNT-500 (5ea.)    
605-1160 ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~500 nm
▪ Typical tip radius: ~5 nm (<7 nm)
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 6,520,000
605-0160 Unmounted Type 6,480,000
  Hi'Res-C14/Cr-Au (5ea.)    
605-1155 ▪ Non-contact cantilever with low resonant frequency 
▪ Backside reflective coating (Au)
▪ Typical spike length: 100 - 200 nm
▪ Typical tip radius: ~1 nm
▪ k = ~5 N/m, f = ~160 kHz
Mounted Type 772,000
605-0155 Unmounted Type 707,000
  OMCL-AC240TS (10ea.)    
610-1184 ▪ Non-Contact cantilever with low resonant frequency
▪ Backside reflective coating (Al)
▪ Tetrahedral tip on zero setback position
▪ Typical tip length: 14 μm
▪ Typical tip radius: 7 nm
▪ k = ~2 N/m, f = ~70 kHz
Mounted Type 507,000
610-0184 Unmounted Type 429,000
  PPP-XYNCSTR (10ea.)    
610-1280 ▪ Non-contact/Tapping Mode cantilever
▪ Backside reflex coating (Al)
▪ Tip shape: 4-sided
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~7 nm
▪ k = ~7.4 N/m, f = ~160 kHz
Mounted Type 591,000
610-0280 Unmounted Type 461,000
  ATEC-NCAu (10ea.)    
610-1209 ▪ Non-contact cantilever
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral tip on zero setback position
▪ Tip coated with Cr-Au
▪ Typical tip length: 15 - 20 μm
▪ Typical tip radius: ~63 nm
▪ k = ~45 N/m, f = ~335 kHz
Mounted Type 1,466,000
610-0209 Unmounted Type 1,271,000
  EBD-24 (5ea.)    
605-1295 ▪ Non-contact cantilever
▪ Backside reflex coating
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~24 μm
▪ k = ~40 N/m, f = ~320 kHz
Mounted Type 6,442,000
605-0295 Unmounted Type 6,312,000
  240AC-NA (24 ea.)    
624-1297 ▪ Non-Contact cantilever with low resonant frequency
▪ Backside reflective coating (Al)
▪ Tetrahedral tip on zero setback position
▪ Typical tip length: 14 μm
▪ Typical tip radius: <7 nm
▪ k = ~2 N/m, f = ~70 kHz
Mounted Type 1,044,000
624-0297 Unmounted Type 734,000
  Scout 70 (10ea.)    
610-1305 ▪ Non-Contact cantilever with low resonant frequency
▪ Backside reflective coating (Al)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~5 nm (<10 nm)
▪ k = ~2 N/m, f = ~70 kHz
Mounted Type 545,000
610-0305 Unmounted Type 416,000
  Scout 150 (10ea.)    
610-1315 ▪ Non-contact cantilever
▪ Backside reflex coating (Al)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~5 nm (<10 nm)
▪ k = ~18 N/m, f = ~150 kHz
Mounted Type 545,000
610-0315 Unmounted Type 416,000
  ISC-125C40-R (5ea.)    
605-1312 ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflex coating (Al)
▪ Typical spike length: ~7 μm
▪ Typical tip radius: <10 nm
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 477,000
605-0312 Unmounted Type 364,000
  EBD-16 (5ea.)    
605-1276 ▪ Non-contact cantilever with high aspect ratio tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~16 um
▪ k = ~40 N/m, f = ~320 kHz
NOTE: Requires ESD-safe Package for EBD Tips (370-0413) for shipment.
Mounted Type 3,222,000
605-0276 Unmounted Type 3,108,000
  160AC-NG (10ea.)    
610-1322 ▪ Probe suitable for tapping mode
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Typical tip length: ~14 μm
▪ Typical tip radius: <7 nm
▪ k = ~26 N/m, f = ~300 kHz
Mounted Type 477,000
610-0322 Unmounted Type 364,000
  PPP-CONTSCR (10ea.)    
610-1093 ▪ Contact cantilever
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~0.2 N/m, f = ~25 kHz
Mounted Type 551,000
610-0093 Unmounted Type 437,000
  NSC36/Al BS (10ea.)    
610-1001 ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 416,000
610-0001 Unmounted Type 286,000
  NSC36/Hard/Al BS (10ea.)    
610-1004 ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Hard Diamond-Like-Carbon coated tip
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <20 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 507,000
610-0004 Unmounted Type 377,000
  PNP-DB (10ea.)    
610-1145 ▪ Non-Contact cantilever with high resonant frequency
▪ Backside reflective coating (Al)
▪ Tip shape: Sharpened tetrahedral on zero setback position
▪ Typical tip length: ~14 μm
▪ Typical tip radius: ~7 nm
▪ k = ~26 N/m, f = ~300 kHz
Mounted Type 448,000
610-0145 Unmounted Type 318,000
  PNP-TR (10ea.)    
610-1146 ▪ Contact cantilever made of silicon nitride
▪ Backside reflective coating (Au)
▪ Tip shape: Pyramidal
▪ k1 = ~0.32 N/m, f1 = ~67 kHz, k2 = ~0.08 N/m, f2 = ~17 kHz
▪ 2 triangular cantilevers on a chip
Mounted Type 448,000
610-0146 Unmounted Type 318,000
  PPP-LFMR (10ea.)    
610-1076 ▪ Contact cantilever with high sensitivity for lateral/frictional force measurement
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~0.2 N/m, f = ~23 kHz
Mounted Type 629,000
610-0076 Unmounted Type 500,000
  OMCL-AC200TS (10ea.)    
610-1187 ▪ Probe suitable for tapping
▪ Backside reflective coating (Al)
▪ Tetrahedral tip on zero setback position
▪ Typical tip length: 14 μm
▪ Typical tip radius: 7 nm
▪ k = ~9 N/m, f = ~150 kHz
Mounted Type 648,000
610-0187 Unmounted Type 519,000
  SHOCONA (10ea.)    
610-1108 ▪ Contact cantilever
▪ Backside reflex coating (Al)
▪ Tip shape: Pyramidal
▪ Typical tip length: 14 - 16 μm
▪ Typical tip radius: <6 nm
▪ k = ~0.14 N/m, f = ~21 kHz
Mounted Type 551,000
610-0108 Unmounted Type 422,000
  200AC-NA (24 ea.)    
624-1296 ▪ Probe suitable for tapping
▪ Backside reflective coating (Al)
▪ Tetrahedral tip on zero setback position
▪ Typical tip length: 14 μm
▪ Typical tip radius: <7 nm
▪ k = ~9 N/m, f = ~135 kHz
Mounted Type 1,044,000
624-0296 Unmounted Type 734,000
  3XC-NA (24 ea.)    
624-1298 ▪ Probe suitable for contact or tapping mode
▪ Backside reflex coating (Al)
▪ Typical tip length: ~14 μm
▪ Typical tip radius: <7 nm
▪ k1 = ~0.3 N/m, f1 = ~17 kHz, k2 = ~9 N/m, f2 = ~150 kHz, k3 = ~2.5 N/m, f3 = ~75 kHz
Mounted Type 1,044,000
624-0298 Unmounted Type 734,000
  HQ:CSC17/Pt (15ea.)    
615-1320 ▪ Probe suitable for contact mode
▪ Backside reflex coating (Cr/Pt-Ir5)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~13 kHz
Mounted Type 624,000
615-0320 Unmounted Type 454,000
  HQ:CSC17/Cr-Au (15ea.)    
615-1233 ▪ Probe suitable for contact, LFM and C-AFM
▪ Backside reflex coating (Cr-Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 15 μm
▪ Typical tip radius: <35 nm
▪ k = ~0.18 N/m, f = ~13 kHz
Mounted Type 624,000
615-0233 Unmounted Type 454,000
  PPP-FMR (10ea.)    
610-1110 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~2 N/m, f = ~75 kHz
Mounted Type 629,000
610-0110 Unmounted Type 500,000
  DT-FMR (10ea.)    
610-1077 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating
▪ Diamond coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~6.2 N/m, f = ~105 kHz
Mounted Type 2,022,000
610-0077 Unmounted Type 1,828,000
  PPP-NCSTR (10ea.)    
610-1117 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~7.4 N/m, f = ~160 kHz
Mounted Type 629,000
610-0117 Unmounted Type 500,000
  NSC36/Al BS (10ea.)    
610-1001 ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 416,000
610-0001 Unmounted Type 286,000
  NSC14/Hard/Al BS (10ea.)    
610-1140 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflective coating (Al)
▪ Hard Diamond-Like-Carbon coated tip
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <20 nm
▪ k = ~5 N/m, f = ~160 kHz
Mounted Type 507,000
610-0140 Unmounted Type 377,000
  SD-R30-CONT (10ea.)    
610-1230 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~0.2 N/m, f = ~13 kHz
Mounted Type 856,000
610-0230 Unmounted Type 778,000
  SD-R30-FM (10ea.)    
610-1229 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 856,000
610-0229 Unmounted Type 778,000
  SD-R30-NCH (10ea.)    
610-1228 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 856,000
610-0228 Unmounted Type 778,000
  MSS-Soft (5ea.)    
605-1254 ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical spike length: ~250 nm
▪ Typical tip radius: <2 nm
▪ k = ~2.8 N/m, f = ~75 kHz

▪NOTE: Requires ESD-safe Package (370-0413) for EBD Tips for shipment.
Mounted Type 1,847,000
605-0254 Unmounted Type 1,782,000
  SSS-FMR (10ea.)    
610-1245 ▪ Cantilever with force constant suitable for FMM with super sharp tip
▪ Backside reflex coating (Al)
▪ Typical tip radius: 2 nm (< 5 nm)
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,361,000
610-0245 Unmounted Type 1,167,000
  NSC19/Al BS (15ea.)    
615-1291 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflective coating (Al)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm
▪ k = ~0.5 N/m, f = ~65 kHz
Mounted Type 623,000
615-0291 Unmounted Type 429,000
  SD-R150-FM (10ea.)    
610-1301 ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~90 nm (from front) / 160 nm (from side)
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 856,000
610-0301 Unmounted Type 726,000
  SD-Sphere-FM-M (10ea.)    
610-1302 ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical sphere diameter: ~2 μm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 2,049,000
610-0302 Unmounted Type 1,854,000
  SD-Sphere-NCH-M (10ea.)    
610-1303 ▪ Cantilever for Non-contact mode
▪ Typical tip length: 10 - 15 μm
▪ Typical sphere diameter: ~2 μm
▪ k = ~42 N/m, f = ~320 kHz
Mounted Type 2,049,000
610-0303 Unmounted Type 1,854,000
  Multi75Al-G (10ea.)    
610-1321 ▪ Probe suitable for force modulation mode
▪ Backside reflective coating (Al)
▪ Tip shape: Rotated
▪ Typical tip length: ~17 μm
▪ Typical tip radius: <10 nm
▪ k = ~3 N/m, f = ~75 kHz
Mounted Type 381,000
610-0321 Unmounted Type 267,000
  NSC36/Cr-Au (10ea.)    
610-1002 ▪ Probe for EFM/KPFM and bio application
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 474,000
610-0002 Unmounted Type 345,000
  NSC14/Cr-Au (10ea.)    
610-1013 ▪ Probe for EFM/KPFM
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k = ~5 N/m, f = ~160 kHz
Mounted Type 474,000
610-0013 Unmounted Type 345,000
  PPP-NCSTAu (10ea.)    
610-1009 ▪ Probe for EFM/KPFM
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Au
▪ Typical tip length: 10 - 15 μm
▪ k = ~7.4 N/m, f = ~160 kHz
Mounted Type 726,000
610-0009 Unmounted Type 597,000
  ElectriMulti75-G (10ea.)    
610-1098 ▪ Probe for electrical modes (EFM/KPFM/DC-EFM/PFM)
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm
▪ k = ~3 N/m, f = ~75 kHz
Mounted Type 474,000
610-0098 Unmounted Type 345,000
  PPP-EFM (10ea.)    
610-1101 ▪ Probe for Conductive AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 824,000
610-0101 Unmounted Type 694,000
  PPP-CONTSCPt (10ea.)    
610-1073 ▪ Probe for DC-EFM/PFM/CP-AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~25 kHz
Mounted Type 824,000
610-0073 Unmounted Type 694,000
  NSC36/Pt (10ea.)    
610-1161 ▪ Probe for DC-EFM/PFM
▪ Backside reflective coating (Pt)
▪ Conductive tip for electrical application, coated with Pt
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <30 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 474,000
610-0161 Unmounted Type 345,000
  PtSi-FM (10ea.)    
610-1039 ▪ Probe for EFM/KPFM
▪ Platinum silicide coating on both sides of the cantilever
▪ Typical tip length: ~ 12.5 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 2,308,000
610-0039 Unmounted Type 2,114,000
  PPP-NCHAu (10ea.)    
610-1074 ▪ Probe for EFM/KPFM
▪ Backside reflex coating (Cr-Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Tip shape: 4-sided pyramidal
▪ Typical tip length: 12.5 μm
▪ Typical tip radius: <50 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 726,000
610-0074 Unmounted Type 597,000
  PPP-NCHPt (10ea.)    
610-1054 ▪ Probe for EFM/KPFM
▪ Backside reflex coating (Cr/Pt-Ir5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Tip shape: 4-sided pyramidal
▪ Typical tip length: 12.5 μm
▪ Typical tip radius: ~25 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 824,000
610-0054 Unmounted Type 694,000
  Spark 350 Pt (10ea.)    
610-1307 ▪ Probe for EFM/KPFM/PFM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm (<30 nm)
▪ k = ~42 N/m, f = ~350 kHz
Mounted Type 629,000
610-0307 Unmounted Type 500,000
  Spark 150 Pt (10ea.)    
610-1316 ▪ Probe for EFM/KPFM/PFM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm (<30 nm)
▪ k = ~18 N/m, f = ~150 kHz
Mounted Type 629,000
610-0316 Unmounted Type 500,000
  Spark 70 Pt (10ea.)    
610-1306 ▪ Probe for EFM/KPFM/PFM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm (<30 nm)
▪ k = ~2 N/m, f = ~70 kHz
Mounted Type 629,000
610-0306 Unmounted Type 500,000
  CDT-CONTR_T (10ea.), CDT-CONTR (10ea.)    
610-1135-01 ▪ Contact cantilever for conductive AFM
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~0.5 N/m, f = ~20 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 2,483,000
610-0135 Unmounted Type 2,224,000
  PPP-CONTSCPt_T (10ea.), PPP-CONTSCPt (10ea.)    
610-1073-01 ▪ Probe for DC-EFM/PFM/C-AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with
Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~25 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 915,000
610-0073 Unmounted Type 694,000
  25Pt300B_T (1), 25Pt300B (10ea.)    
610-1115-01 ▪ Contact cantilever for conductive AFM (C-AFM)/SCM
▪ Solid platinum probe tip and cantilever
▪ Typical tip length: ~80 μm
▪ Typical tip radius: <20 nm
▪ k = ~18 N/m, f = ~20 kHz
▪ Mounted type on Teflon-coated chip carrier
▪ Recommended for high voltage/current application
above ±10 V or 1 µA
Mounted Type 1,401,000
610-0115 Unmounted Type 1,142,000
  NSC18/Cr-Au_T (10ea.), NSC18/Cr-Au (10ea.)    
610-1023-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 564,000
610-0023 Unmounted Type 345,000
  ElectriMulti75-G (10ea.)    
  PPP-EFM_T (10ea.), PPP-EFM (10ea.)    
610-1101-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 824,000
610-0101 Unmounted Type 694,000
  ElectriMulti75-G (10ea.)    
610-1098-01 ▪ Probe for Conductive AFM
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm
▪ k = ~3 N/m, f = ~75 kHz
Mounted Type 564,000
610-0098 Unmounted Type 345,000
  PtSi-CONT_T (10ea.), PtSi-CONT (10ea.)    
610-1121-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Platinum silicide coating on both sides of the cantilever
▪ Typical tip length: ~ 12.5 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~13 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 2,541,000
610-0121 Unmounted Type 2,282,000
  AD-2.8-AS_T (5ea.), AD-2.8-AS (5ea.)    
605-1264-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm
▪ k = ~2.8 N/m, f = ~65 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 1,544,000
605-0264 Unmounted Type 1,284,000
  AD-2.8-SS_T (5ea.), AD-2.8-SS (5ea.)    
605-1266-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: <5 nm
▪ k = ~2.8 N/m, f = ~65 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 2,184,000
605-0266 Unmounted Type 1,925,000
  AD-40-AS_T (5ea.), AD-40-AS (5ea.)    
605-1265-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm
▪ k = ~40 N/m, f = ~180 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 1,544,000
605-0265 Unmounted Type 1,284,000
  AD-40-SS_T (5ea.), AD-40-SS (5ea.)    
605-1267-01 ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: <5 nm
▪ k = ~40 N/m, f = ~180 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 2,184,000
605-0267 Unmounted Type 1,925,000
  PtSi-NCH_T (10ea.), PtSi-NCH (10ea.)    
610-1038-01 ▪ Contact cantilever for conductive AFM (C-AFM)/SCM
▪ Backside reflex coating (PtSi)
▪ Conductive tip for electrical application, coated with PtSi
▪ Tip shape: 4-sided pyramidal
▪ Typical tip length: 12.5 μm
▪ Typical tip radius: ~25 nm
▪ k = ~42 N/m, f = ~330 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 2,373,000
610-0038 Unmounted Type 2,114,000
  PPP-NCSTPt_T (10ea.), PPP-NCSTPt (10ea.)    
610-1043-01 ▪ Probe suitable for Tapping mode and electrical measurements
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Tip shape: 4-sided
▪ Typical tip length: 12.5 μm
▪ Typical tip radius: 25 nm
▪ k = ~7.4 N/m, f = ~160 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 953,000
610-0043 Unmounted Type 694,000
  CDT-NCHR_T (10ea.), CDT-NCHR (10ea.)    
610-1120-01 ▪ Probe suitable for SSRM/lithography
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~80 N/m, f = ~400 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 2,541,000
610-0120 Unmounted Type 2,282,000
  CDT-FMR_T (10ea.), CDT-FMR (10ea.)    
610-1238-01 ▪ Probe suitable for SSRM/lithography
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~6.2 N/m, f = ~105 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 2,541,000
610-0238 Unmounted Type 2,282,000
  AD-2.8-AS_T (5ea.), AD-2.8-AS (5ea.)    
605-1264-01 ▪ Diamond coated tip suitable for SSRM
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm
▪ k = ~2.8 N/m, f = ~65 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 1,544,000
605-0264 Unmounted Type 1,284,000
  AD-2.8-SS_T (5ea.), AD-2.8-SS (5ea.)    
605-1266-01 ▪ Diamond coated tip suitable for SSRM
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: <5 nm
▪ k = ~2.8 N/m, f = ~65 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 2,184,000
605-0266 Unmounted Type 1,925,000
  AD-40-AS_T (5ea.), AD-40-AS (5ea.)    
605-1265-01 ▪ Diamond coated tip suitable for SSRM
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm
▪ k = ~40 N/m, f = ~180 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 1,544,000
605-0265 Unmounted Type 1,284,000
  AD-40-SS_T (5ea.), AD-40-SS (5ea.)    
605-1267-01 ▪ Diamond coated tip suitable for SSRM
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm
▪ k = ~40 N/m, f = ~180 kHz
▪ Unmounted type required for clip type probehand
▪ Mounted type on ceramic plate attached chip carrier
▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module
Mounted Type 2,184,000
605-0267 Unmounted Type 1,925,000
  PPP-EFM_C (10ea.), PPP-EFM (10ea.)    
610-1101-02 ▪ Probe for DC-EFM/PFM/SCM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Mounted type on ceramic chip carrier
▪ Unmounted type required for clip type probehand
Mounted Type 824,000
610-0101 Unmounted Type 694,000
  25Pt300B_C (10ea.), 25Pt300B (10ea.)    
610-1115-02 ▪ Contact cantilever for conductive AFM(CP-AFM)/SCM
▪ Solid platinum probe tip and cantilever
▪ Typical tip length: ~80 μm
▪ Typical tip radius: <20 nm
▪ k = ~18 N/m, f = ~20 kHz
▪ Mounted type on ceramic chip carrier
▪ Unmounted type required for clip type probehand
▪ Recommended for high voltage/current application above ±10 V or 1 µA
Mounted Type 1,336,000
610-0115 Unmounted Type 1,142,000
  Pt-Ir (10ea.)    
610-0150 ▪ 0.25 mm diameter Pt-Ir wire
▪ Tip shape: Sharpened tip end for STM
Cut-wire Type 234,000
  PPP-MFMR (10ea.)    
610-1061 ▪ Probe for MFM
▪ Backside reflex coating (Al)
▪ Hard magnetic coating on the tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <30 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,199,000
610-0061 Unmounted Type 1,070,000
  PPP-LC-MFMR (10ea.)    
610-1062 ▪ Probe for MFM (Low coercivity)
▪ Backside reflex coating (Al)
▪ Soft magnetic coating on the tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <30 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,199,000
610-0062 Unmounted Type 1,070,000
  PPP-LM-MFMR (10ea.)    
610-1063 ▪ Probe for MFM (Low magnetic momentum)
▪ Backside reflex coating (Al)
▪ Hard magnetic coating on the tip with reduced magnetic moment (0.5x) compared to PPP-MFMR
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <30 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,122,000
610-0063 Unmounted Type 993,000
  SSS-MFMR (10ea.)    
610-1064 ▪ Probe for high resolution MFM
▪ Backside reflex coating (Al)
▪ Hard magnetic coating on the tip with reduced magnetic moment (0.25x) compared to PPP-MFMR
▪ Typical tip radius: <15 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 2,022,000
610-0064 Unmounted Type 1,828,000
  NSC18/Co-Cr/Al BS (10ea.)    
610-1026 ▪ Probe for MFM
▪ Backside reflective coating (Al)
▪ Co-Cr coating on the tip
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <60 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 507,000
610-0026 Unmounted Type 377,000
  NanoThermal-10 (10ea.)    
610-1102 ▪ Probe with resistive thermometer tip for SThM
▪ Tip made of NiCr and Pd
▪ Typical tip length: ~10 μm
▪ Typical tip radius: <100 nm
▪ k = ~0.4 N/m
▪ Mounted type only

▪ Note: Thermal Analysis (TA) mode is not supported.
Mounted Type 5,557,000
  NanoThermal-5 (5ea.)    
605-1102 ▪ Probe with resistive thermometer tip for SThM
▪ Tip made of NiCr and Pd
▪ Typical tip length: ~10 μm
▪ Typical tip radius: <100 nm
▪ k = ~0.4 N/m
▪ Mounted type only

▪ Note: Thermal Analysis (TA) mode is not supported.
Mounted Type 3,057,000
  Glass NanoPipette (10ea.)    
704-0046 ▪ Pipette for SICM
▪ Borosilicate glass pipette
▪ Pipette opening diameter: ~100 nm
▪ Minimum order quantities are 10ea
Unmounted Type 65,000
170-0043 ▪ Pipette for SECCM Single Barrel
▪ Borosilicate glass pipette
▪ Pipette opening diameter: ~500 nm
▪ Minimum order quantities are 10ea
Unmounted Type 65,000
  DT-NCHR (10ea.)    
610-1057 ▪ Probe suitable for lithography
▪ Backside reflex coating (Al)
▪ Diamond coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~80 N/m, f = ~400 kHz
Mounted Type 2,022,000
610-0057 Unmounted Type 1,828,000
  ElectriMulti75-G (10ea.)    
610-1098-01 ▪ Probe for lithography and electrical modes (EFM/KPFM/DC-EFM/PFM)
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm
▪ k = ~3 N/m, f = ~75 kHz
Mounted Type 564,000
610-0098 Unmounted Type 345,000
  25Pt300B (10ea.)    
610-1115-01 ▪ Probe suitable for lithography and C-AFM
▪ Contact cantilever made of platinum
▪ Solid platinum probe tip and cantilever
▪ Typical tip length: ~80 μm
▪ Typical tip radius: <20 nm
▪ k = ~18 N/m, f = ~20 kHz
▪ Recommended for high voltage/current application above ±10 V or 1 µA
Mounted Type 1,401,000
610-0115 Unmounted Type 1,142,000
  CDT-CONTR_T (10ea.), CDT-CONTR (10ea.)    
610-1135-01 ▪ Probe suitable for lithography and C-AFM
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~0.5 N/m, f = ~20 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 2,541,000
610-0135 Unmounted Type 2,282,000
  CDT-NCHR_T (10ea.), CDT-NCHR (10ea.)    
610-1120-01 ▪ Probe suitable for SSRM/lithography
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~80 N/m, f = ~400 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 2,541,000
610-0120 Unmounted Type 2,282,000
  PPP-CONTSCPt (10ea.)    
610-1073 ▪ Probe for lithography
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~25 kHz
Mounted Type 824,000
610-0073 Unmounted Type 694,000
  NSC36/Pt (10ea.)    
610-1161 ▪ Probe for lithography
▪ Backside reflective coating (Pt)
▪ Conductive tip for electrical application, coated with Pt
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <30 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 474,000
610-0161 Unmounted Type 345,000
  PPP-EFM (10ea.)    
610-0101 ▪ Probe for lithography
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 824,000
610-0101 Unmounted Type 694,000
  NM-RC-SEM (1ea.)    
761-0285 ▪ Cantilever with high force constant for Nanoindentation
▪ Tip shape: cone
▪ Single crystal diamond tip
▪ Typical tip length: ~500 nm
▪ Typical tip radius: ~10 nm
▪ k = ~350 N/m, f = ~750 kHz
▪ Mounted type only
▪ For exact values of tip radius (SEM image), please refer to the enclosed datasheet
Mounted Type 701,000
  BL-AC40TS (10ea.)    
610-1049 ▪ Probe for imaging soft samples
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Effective tip length: ~3.5 μm (total 7 μm)
▪ Typical tip radius: ~10 nm
▪ k = ~0.09 N/m, f = ~110 kHz
Mounted Type 921,000
610-0049 Unmounted Type 843,000
  DNP-S (10ea.)    
610-1151 ▪ Probe for imaging soft samples
▪ Backside reflective coating (Au)
▪ Typical tip length: 2.5 - 8 μm
▪ Typical tip radius: ~10 nm (<40 nm)
▪ k1 = ~0.35 N/m, f1 = ~65 kHz, k2 = ~0.12 N/m,
f2 = ~23 kHz, k3 = ~0.24 N/m, f3 = ~56 kHz, k4 = ~0.06 N/m, f4 = ~18 kHz,
▪ 4 triangular cantilevers on a chip
Mounted Type 818,000
610-0151 Unmounted Type 662,000
  NSC36/Cr-Au (10ea.)    
610-1002 ▪ Probe for EFM/KPFM and bio application
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 474,000
610-0002 Unmounted Type 345,000
  PNP-DB (10ea.)    
610-1145 ▪ Contact cantilever made of silicon nitride
▪ Backside reflective coating (Au)
▪ Tip shape: Pyramidal
▪ Typical tip length: 3.5 μm
▪ k1 = ~0.48 N/m, f1 = ~67 kHz, k2 = ~0.06 N/m, f2 = ~17 kHz
▪ 2 cantilevers on a chip
Mounted Type 448,000
610-0145 Unmounted Type 318,000
  PNP-TR (10ea.)    
610-1146 ▪ Contact cantilever made of silicon nitride
▪ Backside reflective coating (Au)
▪ Tip shape: Pyramidal
▪ k1 = ~0.32 N/m, f1 = ~67 kHz, k2 = ~0.08 N/m, f2 = ~17 kHz
▪ 2 triangular cantilevers on a chip
Mounted Type 448,000
610-0146 Unmounted Type 318,000
  QP-Bio AC (10ea.)    
610-1283 ▪ Non-Contact cantilever with high resonant frequency
▪ Backside reflective coating (Al)
▪ Typical tip length: 7 μm
▪ Typical tip radius: < 10 nm
▪ k1 = ~0.3 N/m, f1 = ~90 kHz, k2 = ~0.1 N/m, f2 = ~50 kHz, k3 = ~0.06 N/m, f3 = ~30 kHz
▪ 3 triangular cantilevers on a chip
Mounted Type 694,000
610-0283 Unmounted Type 564,000
  OMCL-AC55TS (10ea.)    
610-1199 ▪ Non-contact cantilever with high resonant frequency
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Typical tip length: ~12 μm
▪ Typical tip radius: ~7 nm
▪ k = ~85 N/m, f = ~1600 kHz
Mounted Type 1,050,000
610-0199 Unmounted Type 972,000
  BL-AC40TS (10ea.)    
610-1049 ▪ Probe for imaging soft samples
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Effective tip length: ~3.5 μm (total 7 μm)
▪ Typical tip radius: ~10 nm
▪ k = ~0.09 N/m, f = ~110 kHz
Mounted Type 921,000
610-0049 Unmounted Type 843,000
  NSC36/Cr-Au (10ea.)    
610-1002 ▪ Probe for Tapping Mode in liquid
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 474,000
610-0002 Unmounted Type 345,000
  MSNL (10ea.)    
610-1232 ▪Cantilever for Tapping Mode in liquid
▪ Backside reflex coating (Au)
▪ Typical tip length: 2.5 - 8.0 μm
▪ Typical tip radius: 2 nm
▪ k1 = ~0.07 N/m, f1 = ~22 kHz, k2 = ~0.02 N/m,
f2 = ~15 kHz, k3 = ~0.01 N/m, f3 = ~7 kHz
▪ k4 = ~0.03 N/m, f4 = ~15 kHz, k5 = ~0.1 N/m, f5 = ~38 kHz, k6 = ~0.6 N/m, f6 = ~125 kHz
▪ 6 cantilevers on a chip
Mounted Type 791,000
610-0232 Unmounted Type 662,000
  TAP300DLC (10ea.)    
610-1251 ▪Cantilever for Tapping Mode in liquid
▪ Tip shape: Rotated shape on ~15 μm setback position
▪ Hard diamond-like-carbon coated tip
▪ Typical tip length: 17 μm
▪ Typical tip radius: <15 nm
▪ k = ~40 N/m, f = ~300 kHz
Mounted Type 474,000
610-0251 Unmounted Type 345,000
  PPP-CONT (10ea.)    
610-1111 ▪Cantilever for Tapping Mode in liquid
▪ Typical tip length: 10-15 μm
▪ Typical tip radius: <10 nm
▪ k = ~0.2 N/m, f = ~13 kHz
Mounted Type 591,000
610-0111 Unmounted Type 461,000
  PPP-CONTSC_T (10ea.), PPP-CONTSC (10ea.)    
610-1208-03 ▪ Contact cantilever
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~0.2 N/m, f = ~25 kHz
▪ Mounted type on Teflon-coated (both sides) chip carrier
Mounted Type 591,000
610-0208 Unmounted Type 461,000
  TL-CONT (10ea.)    
610-1069 ▪ Tipless cantilever for special applications
▪ k = ~0.2 N/m, f = ~13 kHz
Mounted Type 591,000
610-0069 Unmounted Type 461,000
  HQ:NSC35/tipless/Al BS (15ea.)    
615-1299 ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al)
▪ k1 = ~8.9 N/m, f1 = ~205 kHz, k2 = ~16 N/m, f2 = ~300 kHz, k3 = ~5.4 N/m, f3 = ~150 kHz
Mounted Type 1,342,000
615-0299 Unmounted Type 1,212,000
  HQ:CSC37/tipless/Al BS (15ea.)    
615-1300 ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al)
▪ k1 = ~0.8 N/m, f1 = ~40 kHz, k2 = ~0.3 N/m, f2 = ~20 kHz, k3 = ~0.4 N/m, f3 = ~30 kHz
Mounted Type 1,342,000
615-0300 Unmounted Type 1,212,000
  ACLA-TL (10ea.)    
610-1317 ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al)
▪ k = ~58 N/m, f = ~190 kHz
Mounted Type 482,000
610-0317 Unmounted Type 369,000
  ACTA-TL (10ea.)    
610-1318 ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al)
▪ k = ~37 N/m, f = ~300 kHz
Mounted Type 482,000
610-0318 Unmounted Type 369,000
  ACSTA-TL (10ea.)    
610-1319 ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al)
▪ k = ~7.8 N/m, f = ~150 kHz
Mounted Type 482,000
610-0319 Unmounted Type 369,000
  ESD-safe Package for EBD Tips    
370-0413 ▪ Contains up to 12 ea. of cantilevers ▪ Cantilevers are not included ▪ Mounting service and returning shipping costs to Park Systems are not included ▪ NOTE: Contact Park Systems for other specific cantilever models or combination.   1,176,000
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