당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오. 아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 담당자
에게 문의 바랍니다.
- Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.
| Part Num. | Model / Description | 한국판매가 (단위:원) 부가세 별도 | |
|---|---|---|---|
| PPP-NCHR (10ea.) | |||
| 610-1051 | ▪ Non-contact cantilever with high resonant frequency ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 551,000 |
| 610-0051 | Unmounted Type | 437,000 | |
| SSS-NCHR (10ea.) | |||
| 610-1056 | ▪ Non-contact cantilever with super sharp tip ▪ Backside reflex coating (Al) ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 1,248,000 |
| 610-0056 | Unmounted Type | 1,070,000 | |
| BL-AC40TS (10ea.) | |||
| 610-1049 | ▪ Probe for imaging soft samples ▪ Backside reflective coating (Au) ▪ Tip shape: Tetrahedral ▪ Effective tip length: ~3.5 μm (total 7 μm) ▪ Typical tip radius: ~10 nm ▪ k = ~0.09 N/m, f = ~110 kHz |
Mounted Type | 921,000 |
| 610-0049 | Unmounted Type | 843,000 | |
| OMCL-AC160TS (10ea.) | |||
| 610-1183 | ▪ Non-Contact cantilever with high resonant frequency ▪ Backside reflective coating (Al) ▪ Tip shape: Sharpened tetrahedral on zero setback position ▪ Typical tip length: ~14 μm ▪ Typical tip radius: ~7 nm ▪ k = ~26 N/m, f = ~300 kHz |
Mounted Type | 507,000 |
| 610-0183 | Unmounted Type | 429,000 | |
| ATEC-NC (10ea.) | |||
| 610-1020 | ▪ Non-contact cantilever ▪ Tip shape: Tetrahedral tip on zero setback position ▪ Typical tip length: 15 - 20 μm ▪ Typical tip radius: <10 nm ▪ k = ~45 N/m, f = ~335 kHz |
Mounted Type | 713,000 |
| 610-0020 | Unmounted Type | 636,000 | |
| ACTA (10ea.) | |||
| 610-1201 | ▪ Non-contact cantilever ▪ Backside reflective coating (Al) ▪ Tip shape: Pyramidal ▪ Typical tip length: 14 - 16 μm ▪ Typical tip radius: ~6 nm ▪ k = ~37 N/m, f = ~300 kHz |
Mounted Type | 500,000 |
| 610-0201 | Unmounted Type | 422,000 | |
| PPP-NCH (10ea.) | |||
| 610-1125 | ▪ Non-contact cantilever with high resonant frequency ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 591,000 |
| 610-0125 | Unmounted Type | 461,000 | |
| SSS-NCH (10ea.) | |||
| 610-1081 | ▪ Non-contact cantilever with super sharp tip ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 1,361,000 |
| 610-0081 | Unmounted Type | 1,167,000 | |
| PPP-NCLR (10ea.) | |||
| 610-1105 | ▪ Non-contact cantilever with low resonant frequency ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 629,000 |
| 610-0105 | Unmounted Type | 500,000 | |
| SSS-NCLR (10ea.) | |||
| 610-1106 | ▪ Non-contact cantilever with low resonant frequency ▪ Backside reflex coating (Al) ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 1,361,000 |
| 610-0106 | Unmounted Type | 1,083,000 | |
| PPP-NCL (10ea.) | |||
| 610-1095 | ▪ Non-contact cantilever with low resonant frequency ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 629,000 |
| 610-0095 | Unmounted Type | 500,000 | |
| SSS-NCL (10ea.) | |||
| 610-1094 | ▪ Non-contact cantilever with low resonant frequency ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 1,248,000 |
| 610-0094 | Unmounted Type | 1,070,000 | |
| NSC15/Al BS (10ea.) | |||
| 610-1011 | ▪ Non-contact cantilever ▪ Backside reflective coating (Al) ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <8 nm ▪ k = ~40 N/m, f = ~325 kHz |
Mounted Type | 389,000 |
| 610-0011 | Unmounted Type | 312,000 | |
| AR5-NCHR (10ea.) | |||
| 610-1055 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Backside reflex coating (Al) ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 1,569,000 |
| 610-0055 | Unmounted Type | 1,374,000 | |
| AR5-NCH (10ea.) | |||
| 610-1127 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 1,418,000 |
| 610-0127 | Unmounted Type | 1,248,000 | |
| AR5-NCLR (10ea.) | |||
| 610-1089 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Backside reflex coating ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~48 N/m, f = ~190 kHz |
Mounted Type | 1,418,000 |
| 610-0089 | Unmounted Type | 1,248,000 | |
| AR5T-NCHR (10ea.) | |||
| 610-1060 | ▪ Non-contact cantilever with high aspect ratio tip (>5:1) ▪ Backside reflex coating (Al) ▪ Tip tilt compensation: 13° ▪ Typical spike length: ~2 μm ▪ Typical tip radius: <15 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 2,256,000 |
| 610-0060 | Unmounted Type | 2,062,000 | |
| AR5T-NCH (10ea.) | |||
| 610-1126 | - Discontinued by manufacturer. AR5T-NCHR (610-0060/610-1060) is recommended | Mounted Type | |
| 610-0126 | Unmounted Type | ||
| HARTA-12-2 (5ea.) | |||
| 605-1123 | ▪ Non-contact cantilever with high aspect ratio tip ▪ Backside reflective coating (Al) ▪ Tip shape: Pyramidal ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~2 μm ▪ Typical tip radius: ~30 nm ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 2,171,000 |
| 605-0123 | Unmounted Type | 2,074,000 | |
| HARTA-12-4 (5ea.) | |||
| 605-1124 | ▪ Non-contact cantilever with high aspect ratio tip ▪ Backside reflective coating (Al) ▪ Tip shape: Pyramidal ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~4 μm ▪ Typical tip radius: ~30 nm ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 2,171,000 |
| 605-0124 | Unmounted Type | 2,074,000 | |
| HARTA-12-6 (5ea.) | |||
| 605-1138 | ▪ Non-contact cantilever with high aspect ratio tip ▪ Backside reflective coating (Al) ▪ Tip shape: Pyramidal ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~6 μm ▪ Typical tip radius: ~30 nm ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 2,171,000 |
| 605-0138 | Unmounted Type | 2,074,000 | |
| EBD2-100A (5ea.) | |||
| 605-1132 | ▪ Non-contact cantilever with high aspect ratio tip (>6:1) (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~2 μm ▪ Typical tip radius: <5 nm ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 2,068,000 |
| 605-0132 | Unmounted Type | 1,971,000 | |
| EBD4-200A (5ea.) | |||
| 605-1139 | ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~4 μm (max.) ▪ Typical tip radius: <5 nm ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 2,068,000 |
| 605-0139 | Unmounted Type | 1,971,000 | |
| EBD6-400A (5ea.) | |||
| 605-1134 | ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~6 μm (max.) ▪ Typical tip radius: <5 nm ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 2,068,000 |
| 605-0134 | Unmounted Type | 1,971,000 | |
| MCNT-100 (5ea.) | |||
| 605-1156 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~100 nm ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 7,290,000 |
| 605-0156 | Unmounted Type | 7,128,000 | |
| MCNT-150 (5ea.) | |||
| 605-1157 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~150 nm ▪ Typical tip radius: ~2 nm (<5 nm) ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 7,290,000 |
| 605-0157 | Unmounted Type | 7,128,000 | |
| MCNT-300 (5ea.) | |||
| 605-1158 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~300 nm ▪ Typical tip radius: ~5 nm (<7 nm) ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 6,520,000 |
| 605-0158 | Unmounted Type | 6,480,000 | |
| MCNT-400 (5ea.) | |||
| 605-1159 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~400 nm ▪ Typical tip radius: ~5 nm (<7 nm) ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 6,520,000 |
| 605-0159 | Unmounted Type | 6,480,000 | |
| MCNT-500 (5ea.) | |||
| 605-1160 | ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: CNT ▪ Tip tilt compensation: 12° ▪ Typical spike length: ~500 nm ▪ Typical tip radius: ~5 nm (<7 nm) ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 6,520,000 |
| 605-0160 | Unmounted Type | 6,480,000 | |
| Hi'Res-C14/Cr-Au (5ea.) | |||
| 605-1155 | ▪ Non-contact cantilever with low resonant frequency ▪ Backside reflective coating (Au) ▪ Typical spike length: 100 - 200 nm ▪ Typical tip radius: ~1 nm ▪ k = ~5 N/m, f = ~160 kHz |
Mounted Type | 772,000 |
| 605-0155 | Unmounted Type | 707,000 | |
| OMCL-AC240TS (10ea.) | |||
| 610-1184 | ▪ Non-Contact cantilever with low resonant frequency ▪ Backside reflective coating (Al) ▪ Tetrahedral tip on zero setback position ▪ Typical tip length: 14 μm ▪ Typical tip radius: 7 nm ▪ k = ~2 N/m, f = ~70 kHz |
Mounted Type | 507,000 |
| 610-0184 | Unmounted Type | 429,000 | |
| PPP-XYNCSTR (10ea.) | |||
| 610-1280 | ▪ Non-contact/Tapping Mode cantilever ▪ Backside reflex coating (Al) ▪ Tip shape: 4-sided ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~7 nm ▪ k = ~7.4 N/m, f = ~160 kHz |
Mounted Type | 591,000 |
| 610-0280 | Unmounted Type | 461,000 | |
| ATEC-NCAu (10ea.) | |||
| 610-1209 | ▪ Non-contact cantilever ▪ Backside reflective coating (Au) ▪ Tip shape: Tetrahedral tip on zero setback position ▪ Tip coated with Cr-Au ▪ Typical tip length: 15 - 20 μm ▪ Typical tip radius: ~63 nm ▪ k = ~45 N/m, f = ~335 kHz |
Mounted Type | 1,466,000 |
| 610-0209 | Unmounted Type | 1,271,000 | |
| EBD-24 (5ea.) | |||
| 605-1295 | ▪ Non-contact cantilever ▪ Backside reflex coating ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~24 μm ▪ k = ~40 N/m, f = ~320 kHz |
Mounted Type | 6,442,000 |
| 605-0295 | Unmounted Type | 6,312,000 | |
| 240AC-NA (24 ea.) | |||
| 624-1297 | ▪ Non-Contact cantilever with low resonant frequency ▪ Backside reflective coating (Al) ▪ Tetrahedral tip on zero setback position ▪ Typical tip length: 14 μm ▪ Typical tip radius: <7 nm ▪ k = ~2 N/m, f = ~70 kHz |
Mounted Type | 1,044,000 |
| 624-0297 | Unmounted Type | 734,000 | |
| Scout 70 (10ea.) | |||
| 610-1305 | ▪ Non-Contact cantilever with low resonant frequency ▪ Backside reflective coating (Al) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~5 nm (<10 nm) ▪ k = ~2 N/m, f = ~70 kHz |
Mounted Type | 545,000 |
| 610-0305 | Unmounted Type | 416,000 | |
| Scout 150 (10ea.) | |||
| 610-1315 | ▪ Non-contact cantilever ▪ Backside reflective coating (Al) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~5 nm (<10 nm) ▪ k = ~18 N/m, f = ~150 kHz |
Mounted Type | 545,000 |
| 610-0315 | Unmounted Type | 416,000 | |
| Scout 350 | |||
| 610-1323 | ▪ Non-contact cantilever ▪ Backside reflex coating (Al) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~5 nm (<10 nm) ▪ k = ~42 N/m, f = ~350 kHz |
Mounted Type | 676,000 |
| 610-0323 | Unmounted Type | 526,000 | |
| ISC-125C40-R (5ea.) | |||
| 605-1312 | ▪ Non-contact cantilever with high aspect ratio tip ▪ Backside reflex coating (Al) ▪ Typical spike length: ~7 μm ▪ Typical tip radius: <10 nm ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 477,000 |
| 605-0312 | Unmounted Type | 364,000 | |
| EBD-16 (5ea.) | |||
| 605-1276 | ▪ Non-contact cantilever with high aspect ratio tip (HDC/DLC) ▪ Backside reflex coating ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical tip length: ~16 um ▪ k = ~40 N/m, f = ~320 kHz NOTE: Requires ESD-safe Package for EBD Tips (370-0413) for shipment. |
Mounted Type | 3,222,000 |
| 605-0276 | Unmounted Type | 3,108,000 | |
| 160AC-NG (10ea.) | |||
| 610-1322 | ▪ Probe suitable for tapping mode ▪ Backside reflective coating (Au) ▪ Tip shape: Tetrahedral ▪ Typical tip length: ~14 μm ▪ Typical tip radius: <7 nm ▪ k = ~26 N/m, f = ~300 kHz |
Mounted Type | 477,000 |
| 610-0322 | Unmounted Type | 364,000 | |
| PPP-CONTSCR (10ea.) | |||
| 610-1093 | ▪ Contact cantilever ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~0.2 N/m, f = ~25 kHz |
Mounted Type | 551,000 |
| 610-0093 | Unmounted Type | 437,000 | |
| NSC36/Al BS (10ea.) | |||
| 610-1001 | ▪ Contact cantilever ▪ Backside reflective coating (Al) ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <8 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 416,000 |
| 610-0001 | Unmounted Type | 286,000 | |
| NSC36/Hard/Al BS (10ea.) | |||
| 610-1004 | ▪ Contact cantilever ▪ Backside reflective coating (Al) ▪ Hard Diamond-Like-Carbon coated tip ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <20 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 507,000 |
| 610-0004 | Unmounted Type | 377,000 | |
| PNP-DB (10ea.) | |||
| 610-1145 | ▪ Non-Contact cantilever with high resonant frequency ▪ Backside reflective coating (Al) ▪ Tip shape: Sharpened tetrahedral on zero setback position ▪ Typical tip length: ~14 μm ▪ Typical tip radius: ~7 nm ▪ k = ~26 N/m, f = ~300 kHz |
Mounted Type | 448,000 |
| 610-0145 | Unmounted Type | 318,000 | |
| PNP-TR (10ea.) | |||
| 610-1146 | ▪ Contact cantilever made of silicon nitride ▪ Backside reflective coating (Au) ▪ Tip shape: Pyramidal ▪ k1 = ~0.32 N/m, f1 = ~67 kHz, k2 = ~0.08 N/m, f2 = ~17 kHz ▪ 2 triangular cantilevers on a chip |
Mounted Type | 448,000 |
| 610-0146 | Unmounted Type | 318,000 | |
| PPP-LFMR (10ea.) | |||
| 610-1076 | ▪ Contact cantilever with high sensitivity for lateral/frictional force measurement ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~0.2 N/m, f = ~23 kHz |
Mounted Type | 629,000 |
| 610-0076 | Unmounted Type | 500,000 | |
| OMCL-AC200TS (10ea.) | |||
| 610-1187 | ▪ Probe suitable for tapping ▪ Backside reflective coating (Al) ▪ Tetrahedral tip on zero setback position ▪ Typical tip length: 14 μm ▪ Typical tip radius: 7 nm ▪ k = ~9 N/m, f = ~150 kHz |
Mounted Type | 648,000 |
| 610-0187 | Unmounted Type | 519,000 | |
| SHOCONA (10ea.) | |||
| 610-1108 | ▪ Contact cantilever ▪ Backside reflex coating (Al) ▪ Tip shape: Pyramidal ▪ Typical tip length: 14 - 16 μm ▪ Typical tip radius: <6 nm ▪ k = ~0.14 N/m, f = ~21 kHz |
Mounted Type | 551,000 |
| 610-0108 | Unmounted Type | 422,000 | |
| 200AC-NA (24 ea.) | |||
| 624-1296 | ▪ Probe suitable for tapping ▪ Backside reflective coating (Al) ▪ Tetrahedral tip on zero setback position ▪ Typical tip length: 14 μm ▪ Typical tip radius: <7 nm ▪ k = ~9 N/m, f = ~135 kHz |
Mounted Type | 1,044,000 |
| 624-0296 | Unmounted Type | 734,000 | |
| 3XC-NA (24 ea.) | |||
| 624-1298 | ▪ Probe suitable for contact or tapping mode ▪ Backside reflex coating (Al) ▪ Typical tip length: ~14 μm ▪ Typical tip radius: <7 nm ▪ k1 = ~0.3 N/m, f1 = ~17 kHz, k2 = ~9 N/m, f2 = ~150 kHz, k3 = ~2.5 N/m, f3 = ~75 kHz |
Mounted Type | 1,044,000 |
| 624-0298 | Unmounted Type | 734,000 | |
| HQ:CSC17/Pt (15ea.) | |||
| 615-1320 | ▪ Probe suitable for contact mode ▪ Backside reflex coating (Cr/Pt-Ir5) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~13 kHz |
Mounted Type | 624,000 |
| 615-0320 | Unmounted Type | 454,000 | |
| HQ:CSC17/Cr-Au (15ea.) | |||
| 615-1233 | ▪ Probe suitable for contact, LFM and C-AFM ▪ Backside reflex coating (Cr-Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 15 μm ▪ Typical tip radius: <35 nm ▪ k = ~0.18 N/m, f = ~13 kHz |
Mounted Type | 624,000 |
| 615-0233 | Unmounted Type | 454,000 | |
| PPP-FMR (10ea.) | |||
| 610-1110 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~2 N/m, f = ~75 kHz |
Mounted Type | 629,000 |
| 610-0110 | Unmounted Type | 500,000 | |
| DT-FMR (10ea.) | |||
| 610-1077 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflex coating ▪ Diamond coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~6.2 N/m, f = ~105 kHz |
Mounted Type | 2,022,000 |
| 610-0077 | Unmounted Type | 1,828,000 | |
| PPP-NCSTR (10ea.) | |||
| 610-1117 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~7.4 N/m, f = ~160 kHz |
Mounted Type | 629,000 |
| 610-0117 | Unmounted Type | 500,000 | |
| NSC36/Al BS (10ea.) | |||
| 610-1001 | ▪ Contact cantilever ▪ Backside reflective coating (Al) ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <8 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 416,000 |
| 610-0001 | Unmounted Type | 286,000 | |
| NSC14/Hard/Al BS (10ea.) | |||
| 610-1140 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflective coating (Al) ▪ Hard Diamond-Like-Carbon coated tip ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <20 nm ▪ k = ~5 N/m, f = ~160 kHz |
Mounted Type | 507,000 |
| 610-0140 | Unmounted Type | 377,000 | |
| SD-R30-CONT (10ea.) | |||
| 610-1230 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~30 nm ▪ k = ~0.2 N/m, f = ~13 kHz |
Mounted Type | 856,000 |
| 610-0230 | Unmounted Type | 778,000 | |
| SD-R30-FM (10ea.) | |||
| 610-1229 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~30 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 856,000 |
| 610-0229 | Unmounted Type | 778,000 | |
| SD-R30-NCH (10ea.) | |||
| 610-1228 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~30 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 856,000 |
| 610-0228 | Unmounted Type | 778,000 | |
| MSS-Soft (5ea.) | |||
| 605-1254 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical spike length: ~250 nm ▪ Typical tip radius: <2 nm="" br="">▪ k = ~2.8 N/m, f = ~75 kHz ▪NOTE: Requires ESD-safe Package (370-0413) for EBD Tips for shipment. |
Mounted Type | 1,847,000 |
| 605-0254 | Unmounted Type | 1,782,000 | |
| SSS-FMR (10ea.) | |||
| 610-1245 | ▪ Cantilever with force constant suitable for FMM with super sharp tip ▪ Backside reflex coating (Al) ▪ Typical tip radius: 2 nm (< 5 nm) ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 1,361,000 |
| 610-0245 | Unmounted Type | 1,167,000 | |
| NSC19/Al BS (15ea.) | |||
| 615-1291 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflective coating (Al) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <8 nm ▪ k = ~0.5 N/m, f = ~65 kHz |
Mounted Type | 623,000 |
| 615-0291 | Unmounted Type | 429,000 | |
| SD-R150-FM (10ea.) | |||
| 610-1301 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~90 nm (from front) / 160 nm (from side) ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 856,000 |
| 610-0301 | Unmounted Type | 726,000 | |
| SD-Sphere-FM-M (10ea.) | |||
| 610-1302 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical sphere diameter: ~2 μm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 2,049,000 |
| 610-0302 | Unmounted Type | 1,854,000 | |
| SD-Sphere-NCH-M (10ea.) | |||
| 610-1303 | ▪ Cantilever for Non-contact mode ▪ Typical tip length: 10 - 15 μm ▪ Typical sphere diameter: ~2 μm ▪ k = ~42 N/m, f = ~320 kHz |
Mounted Type | 2,049,000 |
| 610-0303 | Unmounted Type | 1,854,000 | |
| Multi75Al-G (10ea.) | |||
| 610-1321 | ▪ Probe suitable for force modulation mode ▪ Backside reflective coating (Al) ▪ Tip shape: Rotated ▪ Typical tip length: ~17 μm ▪ Typical tip radius: <10 nm ▪ k = ~3 N/m, f = ~75 kHz |
Mounted Type | 381,000 |
| 610-0321 | Unmounted Type | 267,000 | |
| NSC36/Cr-Au (10ea.) | |||
| 610-1002 | ▪ Probe for EFM/KPFM and bio application ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 474,000 |
| 610-0002 | Unmounted Type | 345,000 | |
| NSC14/Cr-Au (10ea.) | |||
| 610-1013 | ▪ Probe for EFM/KPFM ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k = ~5 N/m, f = ~160 kHz |
Mounted Type | 474,000 |
| 610-0013 | Unmounted Type | 345,000 | |
| PPP-NCSTAu (10ea.) | |||
| 610-1009 | ▪ Probe for EFM/KPFM ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Au ▪ Typical tip length: 10 - 15 μm ▪ k = ~7.4 N/m, f = ~160 kHz |
Mounted Type | 726,000 |
| 610-0009 | Unmounted Type | 597,000 | |
| ElectriMulti75-G (10ea.) | |||
| 610-1098 | ▪ Probe for electrical modes (EFM/KPFM/DC-EFM/PFM) ▪ Backside reflective coating (Cr-Pt) ▪ Tip shape: Rotated ▪ Conductive tip for electrical application, coated with Cr-Pt ▪ Typical tip length: ~7 μm ▪ Typical tip radius: <25 nm ▪ k = ~3 N/m, f = ~75 kHz |
Mounted Type | 474,000 |
| 610-0098 | Unmounted Type | 345,000 | |
| PPP-EFM (10ea.) | |||
| 610-1101 | ▪ Probe for Conductive AFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PrIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~2.8 N/m, f = ~75 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 824,000 |
| 610-0101 | Unmounted Type | 694,000 | |
| PPP-CONTSCPt (10ea.) | |||
| 610-1073 | ▪ Probe for DC-EFM/PFM/CP-AFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~25 kHz |
Mounted Type | 824,000 |
| 610-0073 | Unmounted Type | 694,000 | |
| NSC36/Pt (10ea.) | |||
| 610-1161 | ▪ Probe for DC-EFM/PFM ▪ Backside reflective coating (Pt) ▪ Conductive tip for electrical application, coated with Pt ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <30 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 474,000 |
| 610-0161 | Unmounted Type | 345,000 | |
| PtSi-FM (10ea.) | |||
| 610-1039 | ▪ Probe for EFM/KPFM ▪ Platinum silicide coating on both sides of the cantilever ▪ Typical tip length: ~ 12.5 μm ▪ Typical tip radius: <25 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 2,308,000 |
| 610-0039 | Unmounted Type | 2,114,000 | |
| PPP-NCHAu (10ea.) | |||
| 610-1074 | ▪ Probe for EFM/KPFM ▪ Backside reflex coating (Cr-Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Tip shape: 4-sided pyramidal ▪ Typical tip length: 12.5 μm ▪ Typical tip radius: <50 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 726,000 |
| 610-0074 | Unmounted Type | 597,000 | |
| PPP-NCHPt (10ea.) | |||
| 610-1054 | ▪ Probe for EFM/KPFM ▪ Backside reflex coating (Cr/Pt-Ir5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Tip shape: 4-sided pyramidal ▪ Typical tip length: 12.5 μm ▪ Typical tip radius: ~25 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 824,000 |
| 610-0054 | Unmounted Type | 694,000 | |
| Spark 350 Pt (10ea.) | |||
| 610-1307 | ▪ Probe for EFM/KPFM/PFM ▪ Backside reflective coating (Ti-Pt) ▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~18 nm (<30 nm) ▪ k = ~42 N/m, f = ~350 kHz |
Mounted Type | 629,000 |
| 610-0307 | Unmounted Type | 500,000 | |
| Spark 150 Pt (10ea.) | |||
| 610-1316 | ▪ Probe for EFM/KPFM/PFM ▪ Backside reflective coating (Ti-Pt) ▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~18 nm (<30 nm) ▪ k = ~18 N/m, f = ~150 kHz |
Mounted Type | 629,000 |
| 610-0316 | Unmounted Type | 500,000 | |
| Spark 70 Pt (10ea.) | |||
| 610-1306 | ▪ Probe for EFM/KPFM/PFM ▪ Backside reflective coating (Ti-Pt) ▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~18 nm (<30 nm) ▪ k = ~2 N/m, f = ~70 kHz |
Mounted Type | 629,000 |
| 610-0306 | Unmounted Type | 500,000 | |
| CDT-CONTR_T (10ea.), CDT-CONTR (10ea.) | |||
| 610-1135-01 | ▪ Contact cantilever for conductive AFM ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~0.5 N/m, f = ~20 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 2,483,000 |
| 610-0135 | Unmounted Type | 2,224,000 | |
| PPP-CONTSCPt_T (10ea.), PPP-CONTSCPt (10ea.) | |||
| 610-1073-01 | ▪ Probe for DC-EFM/PFM/C-AFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~25 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 915,000 |
| 610-0073 | Unmounted Type | 694,000 | |
| 25Pt300B_T (1), 25Pt300B (10ea.) | |||
| 610-1115-01 | ▪ Contact cantilever for conductive AFM (C-AFM)/SCM ▪ Solid platinum probe tip and cantilever ▪ Typical tip length: ~80 μm ▪ Typical tip radius: <20 nm ▪ k = ~18 N/m, f = ~20 kHz ▪ Mounted type on Teflon-coated chip carrier ▪ Recommended for high voltage/current application above ±10 V or 1 µA |
Mounted Type | 1,401,000 |
| 610-0115 | Unmounted Type | 1,142,000 | |
| NSC18/Cr-Au_T (10ea.), NSC18/Cr-Au (10ea.) | |||
| 610-1023-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k = ~2.8 N/m, f = ~75 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 564,000 |
| 610-0023 | Unmounted Type | 345,000 | |
| ElectriMulti75-G (10ea.) | |||
| PPP-EFM_T (10ea.), PPP-EFM (10ea.) | |||
| 610-1101-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k = ~2.8 N/m, f = ~75 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 824,000 |
| 610-0101 | Unmounted Type | 694,000 | |
| ElectriMulti75-G (10ea.) | |||
| 610-1098-01 | ▪ Probe for Conductive AFM ▪ Backside reflective coating (Cr-Pt) ▪ Tip shape: Rotated ▪ Conductive tip for electrical application, coated with Cr-Pt ▪ Typical tip length: ~7 μm ▪ Typical tip radius: <25 nm ▪ k = ~3 N/m, f = ~75 kHz |
Mounted Type | 564,000 |
| 610-0098 | Unmounted Type | 345,000 | |
| PtSi-CONT_T (10ea.), PtSi-CONT (10ea.) | |||
| 610-1121-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Platinum silicide coating on both sides of the cantilever ▪ Typical tip length: ~ 12.5 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~13 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 2,541,000 |
| 610-0121 | Unmounted Type | 2,282,000 | |
| AD-2.8-AS_T (5ea.), AD-2.8-AS (5ea.) | |||
| 605-1264-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ k = ~2.8 N/m, f = ~65 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 1,544,000 |
| 605-0264 | Unmounted Type | 1,284,000 | |
| AD-2.8-SS_T (5ea.), AD-2.8-SS (5ea.) | |||
| 605-1266-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: <5 nm ▪ k = ~2.8 N/m, f = ~65 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 2,184,000 |
| 605-0266 | Unmounted Type | 1,925,000 | |
| 605-1265-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ k = ~40 N/m, f = ~180 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 1,544,000 |
| 605-0265 | Unmounted Type | 1,284,000 | |
| 605-1267-01 | ▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: <5 nm ▪ k = ~40 N/m, f = ~180 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 2,184,000 |
| 605-0267 | Unmounted Type | 1,925,000 | |
| PtSi-NCH_T (10ea.), PtSi-NCH (10ea.) | |||
| 610-1038-01 | ▪ Contact cantilever for conductive AFM (C-AFM)/SCM ▪ Backside reflex coating (PtSi) ▪ Conductive tip for electrical application, coated with PtSi ▪ Tip shape: 4-sided pyramidal ▪ Typical tip length: 12.5 μm ▪ Typical tip radius: ~25 nm ▪ k = ~42 N/m, f = ~330 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 2,373,000 |
| 610-0038 | Unmounted Type | 2,114,000 | |
| PPP-NCSTPt_T (10ea.), PPP-NCSTPt (10ea.) | |||
| 610-1043-01 | ▪ Probe suitable for Tapping mode and electrical measurements ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Tip shape: 4-sided ▪ Typical tip length: 12.5 μm ▪ Typical tip radius: 25 nm ▪ k = ~7.4 N/m, f = ~160 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 953,000 |
| 610-0043 | Unmounted Type | 694,000 | |
| CDT-NCHR_T (10ea.), CDT-NCHR (10ea.) | |||
| 610-1120-01 | ▪ Probe suitable for SSRM/lithography ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~80 N/m, f = ~400 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 2,541,000 |
| 610-0120 | Unmounted Type | 2,282,000 | |
| CDT-FMR_T (10ea.), CDT-FMR (10ea.) | |||
| 610-1238-01 | ▪ Probe suitable for SSRM/lithography ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~6.2 N/m, f = ~105 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 2,541,000 |
| 610-0238 | Unmounted Type | 2,282,000 | |
| AD-2.8-AS_T (5ea.), AD-2.8-AS (5ea.) | |||
| 605-1264-01 | ▪ Diamond coated tip suitable for SSRM ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ k = ~2.8 N/m, f = ~65 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 1,544,000 |
| 605-0264 | Unmounted Type | 1,284,000 | |
| AD-2.8-SS_T (5ea.), AD-2.8-SS (5ea.) | |||
| 605-1266-01 | ▪ Diamond coated tip suitable for SSRM ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: <5 nm ▪ k = ~2.8 N/m, f = ~65 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 2,184,000 |
| 605-0266 | Unmounted Type | 1,925,000 | |
| 605-1265-01 | ▪ Diamond coated tip suitable for SSRM ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ k = ~40 N/m, f = ~180 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 1,544,000 |
| 605-0265 | Unmounted Type | 1,284,000 | |
| 605-1267-01 | ▪ Diamond coated tip suitable for SSRM ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ k = ~40 N/m, f = ~180 kHz ▪ Unmounted type required for clip type probehand ▪ Mounted type on ceramic plate attached chip carrier ▪ Mounted type includes an attached wire on the front-side of the chip carrier for the electrical connection of probe to the conductive AFM module |
Mounted Type | 2,184,000 |
| 605-0267 | Unmounted Type | 1,925,000 | |
| PPP-EFM_C (10ea.), PPP-EFM (10ea.) | |||
| 610-1101-02 | ▪ Probe for DC-EFM/PFM/SCM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PrIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~2.8 N/m, f = ~75 kHz ▪ Mounted type on ceramic chip carrier ▪ Unmounted type required for clip type probehand |
Mounted Type | 824,000 |
| 610-0101 | Unmounted Type | 694,000 | |
| 25Pt300B_C (10ea.), 25Pt300B (10ea.) | |||
| 610-1115-02 | ▪ Contact cantilever for conductive AFM(CP-AFM)/SCM ▪ Solid platinum probe tip and cantilever ▪ Typical tip length: ~80 μm ▪ Typical tip radius: <20 nm ▪ k = ~18 N/m, f = ~20 kHz ▪ Mounted type on ceramic chip carrier ▪ Unmounted type required for clip type probehand ▪ Recommended for high voltage/current application above ±10 V or 1 µA |
Mounted Type | 1,336,000 |
| 610-0115 | Unmounted Type | 1,142,000 | |
| Pt-Ir (10ea.) | |||
| 610-0150 | ▪ 0.25 mm diameter Pt-Ir wire ▪ Tip shape: Sharpened tip end for STM |
Cut-wire Type | 234,000 |
| PPP-MFMR (10ea.) | |||
| 610-1061 | ▪ Probe for MFM ▪ Backside reflex coating (Al) ▪ Hard magnetic coating on the tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <30 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 1,199,000 |
| 610-0061 | Unmounted Type | 1,070,000 | |
| PPP-LC-MFMR (10ea.) | |||
| 610-1062 | ▪ Probe for MFM (Low coercivity) ▪ Backside reflex coating (Al) ▪ Soft magnetic coating on the tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <30 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 1,199,000 |
| 610-0062 | Unmounted Type | 1,070,000 | |
| PPP-LM-MFMR (10ea.) | |||
| 610-1063 | ▪ Probe for MFM (Low magnetic momentum) ▪ Backside reflex coating (Al) ▪ Hard magnetic coating on the tip with reduced magnetic moment (0.5x) compared to PPP-MFMR ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <30 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 1,122,000 |
| 610-0063 | Unmounted Type | 993,000 | |
| SSS-MFMR (10ea.) | |||
| 610-1064 | ▪ Probe for high resolution MFM ▪ Backside reflex coating (Al) ▪ Hard magnetic coating on the tip with reduced magnetic moment (0.25x) compared to PPP-MFMR ▪ Typical tip radius: <15 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 2,022,000 |
| 610-0064 | Unmounted Type | 1,828,000 | |
| NSC18/Co-Cr/Al BS (10ea.) | |||
| 610-1026 | ▪ Probe for MFM ▪ Backside reflective coating (Al) ▪ Co-Cr coating on the tip ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <60 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 507,000 |
| 610-0026 | Unmounted Type | 377,000 | |
| NanoThermal-10 (10ea.) | |||
| 610-1102 | ▪ Probe with resistive thermometer tip for SThM ▪ Tip made of NiCr and Pd ▪ Typical tip length: ~10 μm ▪ Typical tip radius: <100 nm ▪ k = ~0.4 N/m ▪ Mounted type only ▪ Note: Thermal Analysis (TA) mode is not supported. |
Mounted Type | 5,557,000 |
| NanoThermal-5 (5ea.) | |||
| 605-1102 | ▪ Probe with resistive thermometer tip for SThM ▪ Tip made of NiCr and Pd ▪ Typical tip length: ~10 μm ▪ Typical tip radius: <100 nm ▪ k = ~0.4 N/m ▪ Mounted type only ▪ Note: Thermal Analysis (TA) mode is not supported. |
Mounted Type | 3,057,000 |
| Glass NanoPipette (10ea.) | |||
| 704-0046 | ▪ Pipette for SICM ▪ Borosilicate glass pipette ▪ Pipette opening diameter: ~100 nm ▪ Minimum order quantities are 10ea |
Unmounted Type | 65,000 |
| 170-0043 | ▪ Pipette for SECCM Single Barrel ▪ Borosilicate glass pipette ▪ Pipette opening diameter: ~500 nm ▪ Minimum order quantities are 10ea |
Unmounted Type | 65,000 |
| DT-NCHR (10ea.) | |||
| 610-1057 | ▪ Probe suitable for lithography ▪ Backside reflex coating (Al) ▪ Diamond coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~80 N/m, f = ~400 kHz |
Mounted Type | 2,022,000 |
| 610-0057 | Unmounted Type | 1,828,000 | |
| ElectriMulti75-G (10ea.) | |||
| 610-1098-01 | ▪ Probe for lithography and electrical modes (EFM/KPFM/DC-EFM/PFM) ▪ Backside reflective coating (Cr-Pt) ▪ Tip shape: Rotated ▪ Conductive tip for electrical application, coated with Cr-Pt ▪ Typical tip length: ~7 μm ▪ Typical tip radius: <25 nm ▪ k = ~3 N/m, f = ~75 kHz |
Mounted Type | 564,000 |
| 610-0098 | Unmounted Type | 345,000 | |
| 25Pt300B (10ea.) | |||
| 610-1115-01 | ▪ Probe suitable for lithography and C-AFM ▪ Contact cantilever made of platinum ▪ Solid platinum probe tip and cantilever ▪ Typical tip length: ~80 μm ▪ Typical tip radius: <20 nm ▪ k = ~18 N/m, f = ~20 kHz ▪ Recommended for high voltage/current application above ±10 V or 1 µA |
Mounted Type | 1,401,000 |
| 610-0115 | Unmounted Type | 1,142,000 | |
| CDT-CONTR_T (10ea.), CDT-CONTR (10ea.) | |||
| 610-1135-01 | ▪ Probe suitable for lithography and C-AFM ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~0.5 N/m, f = ~20 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 2,483,000 |
| 610-0135 | Unmounted Type | 2,224,000 | |
| CDT-NCHR_T (10ea.), CDT-NCHR (10ea.) | |||
| 610-1120-01 | ▪ Probe suitable for SSRM/lithography ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~80 N/m, f = ~400 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 2,541,000 |
| 610-0120 | Unmounted Type | 2,282,000 | |
| PPP-CONTSCPt (10ea.) | |||
| 610-1073 | ▪ Probe for lithography ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~25 kHz |
Mounted Type | 824,000 |
| 610-0073 | Unmounted Type | 694,000 | |
| NSC36/Pt (10ea.) | |||
| 610-1161 | ▪ Probe for lithography ▪ Backside reflective coating (Pt) ▪ Conductive tip for electrical application, coated with Pt ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <30 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 474,000 |
| 610-0161 | Unmounted Type | 345,000 | |
| PPP-EFM (10ea.) | |||
| 610-0101 | ▪ Probe for lithography ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PrIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 824,000 |
| 610-0101 | Unmounted Type | 694,000 | |
| NM-RC-SEM (1ea.) | |||
| 761-0285 | ▪ Cantilever with high force constant for Nanoindentation ▪ Tip shape: cone ▪ Single crystal diamond tip ▪ Typical tip length: ~500 nm ▪ Typical tip radius: ~10 nm ▪ k = ~350 N/m, f = ~750 kHz ▪ Mounted type only ▪ For exact values of tip radius (SEM image), please refer to the enclosed datasheet |
Mounted Type | 701,000 |
| BL-AC40TS (10ea.) | |||
| 610-1049 | ▪ Probe for imaging soft samples ▪ Backside reflective coating (Au) ▪ Tip shape: Tetrahedral ▪ Effective tip length: ~3.5 μm (total 7 μm) ▪ Typical tip radius: ~10 nm ▪ k = ~0.09 N/m, f = ~110 kHz |
Mounted Type | 921,000 |
| 610-0049 | Unmounted Type | 843,000 | |
| DNP-S (10ea.) | |||
| 610-1151 | ▪ Probe for imaging soft samples ▪ Backside reflective coating (Au) ▪ Typical tip length: 2.5 - 8 μm ▪ Typical tip radius: ~10 nm (<40 nm) ▪ k1 = ~0.35 N/m, f1 = ~65 kHz, k2 = ~0.12 N/m, f2 = ~23 kHz, k3 = ~0.24 N/m, f3 = ~56 kHz, k4 = ~0.06 N/m, f4 = ~18 kHz, ▪ 4 triangular cantilevers on a chip |
Mounted Type | 818,000 |
| 610-0151 | Unmounted Type | 662,000 | |
| NSC36/Cr-Au (10ea.) | |||
| 610-1002 | ▪ Probe for EFM/KPFM and bio application ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 474,000 |
| 610-0002 | Unmounted Type | 345,000 | |
| PNP-DB (10ea.) | |||
| 610-1145 | ▪ Contact cantilever made of silicon nitride ▪ Backside reflective coating (Au) ▪ Tip shape: Pyramidal ▪ Typical tip length: 3.5 μm ▪ k1 = ~0.48 N/m, f1 = ~67 kHz, k2 = ~0.06 N/m, f2 = ~17 kHz ▪ 2 cantilevers on a chip |
Mounted Type | 448,000 |
| 610-0145 | Unmounted Type | 318,000 | |
| PNP-TR (10ea.) | |||
| 610-1146 | ▪ Contact cantilever made of silicon nitride ▪ Backside reflective coating (Au) ▪ Tip shape: Pyramidal ▪ k1 = ~0.32 N/m, f1 = ~67 kHz, k2 = ~0.08 N/m, f2 = ~17 kHz ▪ 2 triangular cantilevers on a chip |
Mounted Type | 448,000 |
| 610-0146 | Unmounted Type | 318,000 | |
| QP-Bio AC (10ea.) | |||
| 610-1283 | ▪ Non-Contact cantilever with high resonant frequency ▪ Backside reflective coating (Al) ▪ Typical tip length: 7 μm ▪ Typical tip radius: < 10 nm ▪ k1 = ~0.3 N/m, f1 = ~90 kHz, k2 = ~0.1 N/m, f2 = ~50 kHz, k3 = ~0.06 N/m, f3 = ~30 kHz ▪ 3 triangular cantilevers on a chip |
Mounted Type | 694,000 |
| 610-0283 | Unmounted Type | 564,000 | |
| OMCL-AC55TS (10ea.) | |||
| 610-1199 | ▪ Non-contact cantilever with high resonant frequency ▪ Backside reflective coating (Au) ▪ Tip shape: Tetrahedral ▪ Typical tip length: ~12 μm ▪ Typical tip radius: ~7 nm ▪ k = ~85 N/m, f = ~1600 kHz |
Mounted Type | 1,050,000 |
| 610-0199 | Unmounted Type | 972,000 | |
| BL-AC40TS (10ea.) | |||
| 610-1049 | ▪ Probe for imaging soft samples ▪ Backside reflective coating (Au) ▪ Tip shape: Tetrahedral ▪ Effective tip length: ~3.5 μm (total 7 μm) ▪ Typical tip radius: ~10 nm ▪ k = ~0.09 N/m, f = ~110 kHz |
Mounted Type | 921,000 |
| 610-0049 | Unmounted Type | 843,000 | |
| NSC36/Cr-Au (10ea.) | |||
| 610-1002 | ▪ Probe for Tapping Mode in liquid ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 474,000 |
| 610-0002 | Unmounted Type | 345,000 | |
| MSNL (10ea.) | |||
| 610-1232 | ▪Cantilever for Tapping Mode in liquid ▪ Backside reflex coating (Au) ▪ Typical tip length: 2.5 - 8.0 μm ▪ Typical tip radius: 2 nm ▪ k1 = ~0.07 N/m, f1 = ~22 kHz, k2 = ~0.02 N/m, f2 = ~15 kHz, k3 = ~0.01 N/m, f3 = ~7 kHz ▪ k4 = ~0.03 N/m, f4 = ~15 kHz, k5 = ~0.1 N/m, f5 = ~38 kHz, k6 = ~0.6 N/m, f6 = ~125 kHz ▪ 6 cantilevers on a chip |
Mounted Type | 791,000 |
| 610-0232 | Unmounted Type | 662,000 | |
| TAP300DLC (10ea.) | |||
| 610-1251 | ▪Cantilever for Tapping Mode in liquid ▪ Tip shape: Rotated shape on ~15 μm setback position ▪ Hard diamond-like-carbon coated tip ▪ Typical tip length: 17 μm ▪ Typical tip radius: <15 nm ▪ k = ~40 N/m, f = ~300 kHz |
Mounted Type | 474,000 |
| 610-0251 | Unmounted Type | 345,000 | |
| PPP-CONT (10ea.) | |||
| 610-1111 | ▪Cantilever for Tapping Mode in liquid ▪ Typical tip length: 10-15 μm ▪ Typical tip radius: <10 nm ▪ k = ~0.2 N/m, f = ~13 kHz |
Mounted Type | 591,000 |
| 610-0111 | Unmounted Type | 461,000 | |
| PPP-CONTSC_T (10ea.), PPP-CONTSC (10ea.) | |||
| 610-1208-03 | ▪ Contact cantilever ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~0.2 N/m, f = ~25 kHz ▪ Mounted type on Teflon-coated (both sides) chip carrier |
Mounted Type | 591,000 |
| 610-0208 | Unmounted Type | 461,000 | |
| TL-CONT (10ea.) | |||
| 610-1069 | ▪ Tipless cantilever for special applications ▪ k = ~0.2 N/m, f = ~13 kHz |
Mounted Type | 591,000 |
| 610-0069 | Unmounted Type | 461,000 | |
| HQ:NSC35/tipless/Al BS (15ea.) | |||
| 615-1299 | ▪ Tipless cantilever for special applications ▪ Backside reflex coating (Al) ▪ k1 = ~8.9 N/m, f1 = ~205 kHz, k2 = ~16 N/m, f2 = ~300 kHz, k3 = ~5.4 N/m, f3 = ~150 kHz |
Mounted Type | 1,342,000 |
| 615-0299 | Unmounted Type | 1,212,000 | |
| HQ:CSC37/tipless/Al BS (15ea.) | |||
| 615-1300 | ▪ Tipless cantilever for special applications ▪ Backside reflex coating (Al) ▪ k1 = ~0.8 N/m, f1 = ~40 kHz, k2 = ~0.3 N/m, f2 = ~20 kHz, k3 = ~0.4 N/m, f3 = ~30 kHz |
Mounted Type | 1,342,000 |
| 615-0300 | Unmounted Type | 1,212,000 | |
| ACLA-TL (10ea.) | |||
| 610-1317 | ▪ Tipless cantilever for special applications ▪ Backside reflex coating (Al) ▪ k = ~58 N/m, f = ~190 kHz |
Mounted Type | 482,000 |
| 610-0317 | Unmounted Type | 369,000 | |
| ACTA-TL (10ea.) | |||
| 610-1318 | ▪ Tipless cantilever for special applications ▪ Backside reflex coating (Al) ▪ k = ~37 N/m, f = ~300 kHz |
Mounted Type | 482,000 |
| 610-0318 | Unmounted Type | 369,000 | |
| ACSTA-TL (10ea.) | |||
| 610-1319 | ▪ Tipless cantilever for special applications ▪ Backside reflex coating (Al) ▪ k = ~7.8 N/m, f = ~150 kHz |
Mounted Type | 482,000 |
| 610-0319 | Unmounted Type | 369,000 | |
| ESD-safe Package for EBD Tips | |||
| 370-0413 | ▪ Contains up to 12 ea. of cantilevers ▪ Cantilevers are not included ▪ Mounting service and returning shipping costs to Park Systems are not included ▪ NOTE: Contact Park Systems for other specific cantilever models or combination. | 1,176,000 |
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