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How AFM Works

Atomic force microscopy is arguably the most versatile and powerful microscopy technology for studying samples at nanoscale. It is versatile because an atomic force microscope can not only image in three-dimensional topography, but it also provides various types of surface measurements to the needs of scientists and engineers. It is powerful because an AFM can generate images at atomic resolution with angstrom scale resolution height information, with minimum sample preparation.

So, how does an AFM work? In this page, we introduce you to the principles of an AFM with an easy to understand video animations. Feel free to share this page with others, and to email us if you have any questions.


Contact Mode (접촉방식)

이 방식에서는, 탐침이 시료 표면 위를 접촉한 상태로 스캔하게 됩니다. 탐침이 샘플 표면과 접촉하고 있기 때문에, 탐침이 샘플 표면 위로 지나갈 때 강한 척력이 탐침을 휘게 만듭니다.    Learn More..
 

AFM Principle - How AFM Works | Park Atomic Force Microscope