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temperature controller AFM Conductive AFM Adhesive DIWafer ConductiveAFM LFM EFMAmplitude Film FrequencyModulation #Materials SoftSample PUR Carbon block_copolymer Biofilm Nanofiber Temasek_Lab IRDetector ContactMode dichalcogenide BiFeO3 TungstenThinFilmDeposition Melt Mobile cross section Bacterium fluorocarbon HOPG semifluorinated_alkanes SmalScan Sperm Tungsten PinpointPFM Fe_film Vinylpyridine
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Nanopatterened Graphene on Boron Nitride
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 4.5μm×4.5μm
- Scan Rate: 0.75Hz
- Pixel Size: 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 4.5μm×4.5μm
- Scan Rate: 0.75Hz
- Pixel Size: 512×512