-
CarbonNanotube graphene_hybrid Grain HumanHair PVAC Pinpoint Sapphire Wang Ito AAO Silicon Molybdenum Organic MfmPhase silicon_oxide Alloy PetruPoni CrystalGrowing vertical_PFM Ni81Fe19 YttriaStabilizedZirconia SingleLayer VerticalPFM PinpointPFM OpticalModulator Aggregated_molecules Praseodymium LithiumNiobate KPFM Boundary MolybdenumDisulfide AEAPDES LeakageCurrent Alkane Tape
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Trench Etch Profile on Si Wafer
Top dielectric trench etch profile on Si wafer having tapered slope at the trench sidewall.
Scanning Conditions
- System: NX20
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.21Hz
- Pixel: 1024 × 256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.21Hz
- Pixel: 1024 × 256