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cross section MolybdenumDisulfide Potential 3-hexylthiophene Nanopattern SSRM oxide_layer NUS Stiffness Hydroxyapatite Ceramic CalciumHydroxide hard_disk_media CntFilm Pinpoint HOPG Sic NUS_Physics AEAPDES HardDisk Copper Magnetic Force Microscopy TriGlycineSulphate TungstenThinFilmDeposition Yeditepe FrictionForce Plug Inorganic_Compound SThM PinpointPFM 2-vinylpyridine Al2O3 Lanthanum_aluminate FuelCell SurfaceOxidation
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GaN epi wafer
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 0.7 Hz
- Scan Size : 5μm×5μm
- Pixel Size : 512×512
- Cantilever : PPP-NCHR (k=42N/m, f=330kHz)