-
STO Ecoli TyphimuriumBiofilm C_AFM Ferroelectric membrane LiBattery Vortex Conductivity Electical&Electronics ScanningSpreadingResistanceMicroscopy SmallScan LowDensityPolyethylene 3-hexylthiophene Tape Mapping Phosphide GlassTemperature Calcium Ito Mfm INSP Yeditepe UTEM PpLdpe SiliconeOxide fluorocarbon ElectrostaticForceMicroscopy Aluminium_Oxide Graphite Conducting Magnets cannabinoid aluminum_nitride Styrene
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
CMP test key
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 1Hz for 100μm2 / 1.5Hz for 30μm2
- Scan Size : 100μm2, 30μm2
- Pixel Size : All 1024×512
- Cantilever : CMCL-AC240TS (k=2N/m, f=70kHz)