-
Hafnia Conductive AFM FAPbI3 Tungsten_disulfide GaN HBN norganic CeramicCapacitor alkanes Thermal fluorocarbon Holes Metal-organicComplex P3HT MoirePattern PFM mechanical property Bmp MechanicalProperties Ca10(PO4)6(OH)2 MBE EPFL CNT ForceDistanceSpectroscopy Device GalliumPhosphide ThinFilm CastIron Ecoli TyphimuriumBiofilm Heating TemperatureControlledAFM Polymer Plug Composite
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Chip
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : All 1Hz
- Scan Size : 25μm×40μm, 15μm×40μm, 8μm×4μm
- Pixel Size : 2048×256, 2048×256, 1024×256
- Cantilever : OMCL-AC160TS(k=26N/m, f=300kHz)