-
TipBiasMode Electrical&Electronics Anneal IRDetector ElectrostaticForceMicroscopy OpticalWaveguides vertical_PFM Implant NCM\ ThermalProperties Copper mono_layer Pores MESA structure solar_cell fluorocarbon HOPG ferromagnetic Butterfly FrictionForce NtuEee NUS_NNI_Nanocore MultiferroicMaterials Gold PolymerBlend semifluorinated alkane Tape Litho SmalScan Film SicMosfet Domain Adhesion Bacterium TungstenDeposition
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Cutting Graphene
Scanning Conditions
- System : FX40
- Scan Mode: Contact after lithography
- Scan Rate : 0.7 Hz
- Scan Size : 30μm×30μm
- Pixel Size : 256×256
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)
- Lithography condition : Force 500 nN, writing speed 0.1μm/s, AC bias 10 V @ 40kHz