-
Defects Tapping Gallium AnodizedAluminumOxide Praseodymium SFAs ULCA Chrome Mechanical HOPG Ca10(PO4)6(OH)2 frequency_modulation rubber GaN Electrical&Electronics Granada Grain hard_disk Multiferroic_materials SrTiO3 HexagonalBoronNitride pulsed_laser_deposition semifluorinated_alkanes CrystalGrowing Cobalt-dopedIronOxide polymeric_arrays Styrene SmalScan Zhi PFM NiFe nanobar VinylAlcohol Gong LateralForceMicroscopy
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
HfO2
Scanning Conditions
- System: NX10
- Scan Mode: AM-KPFM
- Cantilever: ElectriMulti75 (k=3 N/m, f=75kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 256×256