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SSRM Scratch Chungnam_National_University lithography MonoLayer Electical&Electronics Transparent NUS_NNI_Nanocore Mfm dielectric_trench PinpointNanomechanicalMode Litho Ni81Fe19 Polymer Protein Fujian Optoelectonics FailureAnlaysis FastScan PolycrystallineFerroelectricBCZT fifber Butterfly C60H122 ChemicalCompound Phase Photovoltaics Annealed PiezoelectricForceMicroscopy heterojunctions ContactModeDots ring shape MESA structure KAIST ContactMode LiquidImaging
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Domain switching on PZT
Scanning Conditions
- System: NX10
- Scan Mode: Lithography, PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Litho. mode: Tip bias mode
- Litho. Tip bias: Black +10V, White -10V