-
Neodymium Pyroelectric temperature_control Christmas C36H74 CrystalGrowing Carbon LightEmiting CBD Step Cancer AIN Corrosion semifluorinated_alkane Film Modulus Anneal CalciumHydroxyapatite Polyurethane chemical_compound TemperatureControllerAFM Varistor PinPointMode Polyvinylidene AAO Jason Sidewall Barium_titanate BlockCopolymer GaP INSP StrontiuTitanate HOPG Polypropylene Glass
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
SiC MOSFET
Scanning Conditions
- System: NX-Hivac
- Scan Mode: SSRM
- Cantilever: Full diamond (k=27 N/m)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×512
- Sample Bias: +2.5V
- Scan Mode: SSRM
- Cantilever: Full diamond (k=27 N/m)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×512
- Sample Bias: +2.5V