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AM_KPFM Crystal non_contact MetalCompound multi_layer Deposition OrganicCompound Spincast Hafnium_dioxide Scanning_Thermal_Microscopy SurfaceOxidation LaAlO3 AEAPDES tip_bias_mode Vortex HexagonalBN self_healing Hafnia H-BN Dr.JurekSadowski Lateral_Force_Microscopy Fujian KPFM Transparent PolymerPatterns Mechanical Anneal light_emission OpticalElement frequency_modulation SRAM LiBattery FM_KPFM dielectric_trench Nanostructure
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Imprint sample
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate:0.25Hz
- Pixel: 256×256
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate:0.25Hz
- Pixel: 256×256