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ThermalDetectors Polarization Cross-section self_healing Trench multi_layer Composition Polyvinylidene_fluoride Wafer CompactDisk ElectroDeposition ScanningSpreadingResistanceMicroscopy LiIonBattery Scanning_Thermal_Microscopy Korea Silver C36H74 FuelCell light_emission self-assembled_monolayer hetero_structure atomic_layer #EC AM_SKPM bias_mode chemical_compound single_layer oxide_layer NusEce Hexatriacontane C_AFM Ito CNT Polytetrafluoroethylene fluoroalkane
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Adhesive system
Scanning Conditions
- System: NX10
- Scan Mode: PinPoint
- Cantilever: ACST (k=7N/m, f=150kHz)
- Scan Size: 30μm×30μm, 20μm×20μm
- Scan Rate: 0.23Hz
- Pixel: 256×256
- Scan Mode: PinPoint
- Cantilever: ACST (k=7N/m, f=150kHz)
- Scan Size: 30μm×30μm, 20μm×20μm
- Scan Rate: 0.23Hz
- Pixel: 256×256