-
Ptfe VerticalPFM NCM Growth non_contact WPlug STM Nanofiber PDMS Current Layer StrontiuTitanate ForceMapping Logo MechanicalProperties SFAs optoelectronics LateralForceMicroscopy ConductiveAFM Austenite IISCBangalore Copper PhaseChange flakes Piezoresponse Flake PinpointPFM NanoLithography PolymerBlend Foil SiWafer Patterns PolycrystallineFerroelectricBCZT Pore Temasek_Lab
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Polymer blend with nanofiber
Scanning Conditions
- System: NX10
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel: 512×512