Advanced Piezoresponse Force Microscopy - optimizing PFM for your applications from off resonance to frequency tracking - June 10, 2020
SPEAKERS
  • Ilka Hermes
    Park Systems Europe GmbH, Mannheim, Germany
Authors
Ilka Hermes

The application the ferroelectric materials in communication and information technology or data storage continuously increases. The optimization ferroelectric devices and investigation of novel applications, such as energy harvesting, are of great interest for the scientific community and require characterization techniques that can access nanoscopic domain patterns. Here, piezoresponse force microscopy (PFM), a contact mode Atomic Force Microscopy method, provides real-space domain information with a nanometer resolution.
In this webinar, we provide an overview and introduction of three available PFM modes: Off-resonance single frequency PFM, resonance-enhanced single frequency PFM and dual frequency resonance tracking (DFRT) PFM. Each of the modes comes with advantages and disadvantages depending on the piezoelectric and topographic properties of the investigated samples. To help you exploit the full potential of PFM, we will to provide you with the information which mode is most suitable for your samples.

This is a prerecorded webinar. The questions asked during the session will be answered per email.