The Latest Advances in AFM for Nanotechnology (Univ. of Arizona)
In partnership with the W.M. Keck Center for Nano-Scale Imaging of the University of Arizona, Park Systems is proud to announce a free workshop and live demo to take place on May 17, 2016 at the University of Arizona. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM System—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.