Beer and Demo - Latest Advances in AFM Metrology
Join us as we introduce you to the latest advances in AFM metrology featuring a talk titled "In-line (3D) AFM as Solution Provider for Beyond N10 Process" from imec Senior Researcher, Dr. Tae-Gon Kim!
Visit our office in Santa Clara on Friday, March 23, 2017 from 5pm - 7pm as we serve some craft brew, bites to eat, and some friendly chatter as we all catch up on our work at the nanoscale and atomic force microscopy (AFM)!