Detect the Defect! Advantages of Automated Atomic Force Microscopy [AFM] for Semiconductor Applications
SEMICON EUROPA 2019, Munich, Germany
Date: Tuesday, November 12 – Friday, November 15, 2019
Time: 12:00 pm
Place: Neue Messe München, Munich, Germany
Enjoy the lunch snacks and the seminar on: “Detect the defect! - on Advantages of Automated Atomic Force Microscopy [AFM] for Semiconductor Applications,” presented by Dr. Christian Froeck.
In the 30-minutes presentation we will be revealing the latest insights into AFM industrial applications such as Automatic Defect Review, 3D surface information, surface roughness, trench depth, via or bump analysis, High Vacuum AFM for Electrical Measurements and Failure Analysis, and more!
The LUNCHEON is open to everyone and is FREE of charge.