34th Surface and Interface Days (JSI 2020) - Paris, France
The 34th edition of The Surface & Interface Days (JSI 2020) will take place on 22 to 24 January 2020 at the Pierre and Marie Curie campus of Sorbonne University, France.
Park Systems France is honored to contribute to the event with a booth and practical hands-on-sessions on Park NX20 large sample AFM!
Get hands on the newest generation of Atomic Force Microscopy (AFM) and sign up for a hands-on-session slot on Park Systems NX20 large sample AFM. Learn about the latest updates in materials’ nanocharacterization with wide range of nanomechanical, magnetic and electrical measuring modes, such as Scanning Spreading Resistance Microscopy SSRM, conductive AFM (C-AFM) and Scanning Capacitance Microscopy (SCM).