The applications staff of Park Systems is proud to present an introduction to PinPoint scanning spreading resistance microscopy (SSRM). SSRM is a scanning probe microscopy (SPM) technique that allows imaging and electrical characterization of a semiconductor materials.SSRM functions by engaging a sample’s surface with a conductive SPM probe. The current flow, produced by the applied bias voltage between the sample and the conductive probe is measured to acquire the electrical data. The PinPoint variant of SSRM, specific to Park Systems AFM, enables image acquisition of both electrical and mechanical data with higher spatial resolution without any lateral force.This webinar session will explain the basics of PinPoint SSRM and review its potential for investigating the electrical and mechanical characteristics of lithium ion battery electrodes.