SmartScan Topography Imaging - April 17, 2020
Park Systems Weekly Demo & Chat Sessions is a new series of online, live demonstrations of Park AFM Systems hosted by the Park Systems Technical team. Each week, an engineer from the technical team will lead a short, specific demo and then discuss it with attendees. This is the first session in the new series. Topography is always the baseline for any atomic force microscopy image. It is the baseline for all other advanced techniques and the basis for the imaging technique as a whole. This session will focus on the finer details of controlling tip sample interaction and controls available to an AFM operator to get the most out of their topography images.