PinPoint™ Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion forces are acquired simultaneously in real-time. While the XY scanner stops, the high speed force-distance curves are taken with well-defined control of contact force and contact time between the tip and the sample. Due to controllable data acquisition time, PinPoint™ Nanomechanical mode allows optimized nanomechanical measurement with high signal-to-noise ratio over various sample surfaces.

Video: Characterizing Multicomponent Polymer with PinPoint™ AFM

[Height]

[Adhesion force]

[Modulus]

Force-Distance (F-d) curves is a spectroscopy technique measuring the vertical interaction between the tip and the sample surface while extending and retracting a Z scanner. Function of a cantilever deflection versus the extension of the piezoelectric scanner is he direct measurement of tip-sample interaction forces reflecting a mechanical property of surface.

The various elastic properties that can be measured from Force vs. Distance curves.

Force Amplitude and Phase Imaging of Sample Elasticity

Our FMM mode measures mechanical property variations over a sample’s surface. An AC modulation is applied to the cantilever while in contact with the sample surface, allowing you to monitor changes in amplitude and phase and gain insights into qualitative elastic and viscous responses.

[Topography]/[FMM Phase]

Mapping of the Frictional Force

Park AFMs are not only capable of detecting cantilever deflections in the vertical direction, but also the lateral, producing a lateral force microscopy image.

Advanced Vector Nanolithography Using Closed Loop Scan System

The Nanolithography mode allows you to manipulate and create patterning on the sample surface through applied force or voltage. Tip position for lithography can be easily controlled by importing your own vector drawings or raster (bitmap) images.

Pattern created on the surface by plowing the surface with the tip (a) and by changing the surface with applied bias (b)

Vector Nanolithography. The image is generated in vector by applying negative voltage between -5 and -10 V. Scanning rate was varied between 1 and 0.1 µm/s. The height of deposited oxide is about 2-4 nm.

Our nanoindentation mode uses excessive force on the cantilever to indent the sample and measure its mechanical properties including hardness and elasticity.

NanoIndentation measures the hardness of a local region by pressing the indenter tip Into a sample.