Nanomechanical Mode
PinPoint™ Nanomechanical Mode


Brochures
PinPoint™ Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion forces are acquired simultaneously in real-time. While the XY scanner stops, the high speed force-distance curves are taken with well-defined control of contact force and contact time between the tip and the sample. Due to controllable data acquisition time, PinPoint™ Nanomechanical mode allows optimized nanomechanical measurement with high signal-to-noise ratio over various sample surfaces.
Video: Characterizing Multicomponent Polymer with PinPoint™ AFM




Force-Distance Spectroscopy
Force Measurement of Tip-Sample Interaction

Force-Distance (F-d) curves is a spectroscopy technique measuring the vertical interaction between the tip and the sample surface while extending and retracting a Z scanner. Function of a cantilever deflection versus the extension of the piezoelectric scanner is he direct measurement of tip-sample interaction forces reflecting a mechanical property of surface.
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Force Volume Imaging
Force Measurement of Tip-Sample Interaction
Force volume imaging provides a detailed map of the sample’s material properties by plotting parameters such as stiffness, cantilever snap-in, and adhesion. Parameters extracted from Force Distance (F-D) spectroscopy curves are put into a matrix that quickly and easily allows researchers to gain insights about samples properties.
Force Modulation Microscopy (FMM)

Force Amplitude and Phase Imaging of Sample Elasticity
Our FMM mode measures mechanical property variations over a sample’s surface. An AC modulation is applied to the cantilever while in contact with the sample surface, allowing you to monitor changes in amplitude and phase and gain insights into qualitative elastic and viscous responses.
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Lateral Force Microscopy (LFM)

Mapping of the Frictional Force
Park AFMs are not only capable of detecting cantilever deflections in the vertical direction, but also the lateral, producing a lateral force microscopy image.
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Nanolithography

Advanced Vector Nanolithography Using Closed Loop Scan System
The Nanolithography mode allows you to manipulate and create patterning on the sample surface through applied force or voltage. Tip position for lithography can be easily controlled by importing your own vector drawings or raster (bitmap) images.
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Nanoindentation

Our nanoindentation mode uses excessive force on the cantilever to indent the sample and measure its mechanical properties including hardness and elasticity.
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Spring Constant Calibration by Thermal Method
Maintaining the proper spring calibration is critical for AFM force data accuracy. That’s why Park provides spring calibration using the thermal method, giving you accurate readings every time.