|Contact Us  Global

Live Demo

5, Jun 20'
Live Demo
Image size and lateral resolution in Atomic Force Microscope (AFM) images are generally traded off against each other as the AFM records a certain number of pixels per a given scan length, as defined by the operator.    ...
29, May 20'
Live Demo
This session will demonstrate this technique and focus on Approach Retract Scanning (ARS) to image with a pipette using Park Systems AFM.     SmartScan SICM Imaging REGISTER NOW ...
22, May 20'
Live Demo
Park AFM’s nanolithography is an advanced AFM technique used to pattern nanoscale shapes onto sample surfaces. In the bias-assisted or anodic oxidation method, a bias voltage is applied to the tip to generate an oxide pattern on a metallic o...
15, May 20'
Live Demo
Scanning Capacitance Microscopy (SCM) is an advanced imaging mode of Park AFM used to map various doping levels of non-uniformly doped semiconductor samples.     SmartScan SCM Imaging REGISTER NOW ...
6, May 20'
Live Demo
In this LIVE DEMO on the NX-Wafer Automated AFM we will introduce you to the inline metrology capabilities which are needed for full-automatic quality control.     Full-automation AFM in-line capabilities with the NX-W...
1, May 20'
Live Demo
Magnetic force microscopy (MFM) is a Park Systems advanced AFM mode used for studying surfaces with magnetic properties by detecting the interaction between a magnetized cantilever and the sample surface.     Smart...
24, Apr 20'
Live Demo
Measuring the electrostatic interaction between the atomic force microscope (AFM) tip and sample is a common technique used to characterize electrically sensitive samples.     SmartScan Advanced KPFM Imaging ...
22, Apr 20'
Live Demo
In this Live Demo we will walk you through the quick automation set-up for research applications by using SmartScan & StepScan.     From automatization in research to quality control for industrial applications (NX20 ...
17, Apr 20'
Live Demo
Park Systems Weekly Demo & Chat Sessions is a new series of online, live demonstrations of Park AFM Systems hosted by the Park Systems Technical team. Each week, an engineer from the technical team will lead a short, specific demo and then discuss it...
15, Apr 20'
Live Demo
In this Live Demo we will walk you through the quick automation set-up for research applications by using SmartScan & StepScan.     Quick automation set-up for research applications (SmartScan™ & StepScan™...

Live Demo - Park Atomic Force Microscope