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Park Systems Weekly Demo & Chat Sessions is a new series of online, live demonstrations of Park AFM Systems hosted by the Park Systems Technical team. Each week, an engineer from the technical team will lead a short, specific demo and then discuss it with attendees. This is the first session in the new series.

 
 
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SmartScan Topography Imaging

Friday, April 17, 2020

  • 3:00 pm
    (EDT)
    Boston, New York
  • 12:00 pm
    (PDT)
    San Francisco, LA
  • 8:00 pm
    (GMT)
    London
  • 9:00 pm
    (CET)
    Paris, Rome

True Non-ContactTM Mode

True Non-ContactTM Image of Cellulose nanowhisker rods approximately 100 to 1000 nm long and 1 to 3 nm wide.

Park Systems Weekly Demo & Chat Sessions is a new series of online, live demonstrations of Park AFM Systems hosted by the Park Systems Technical team. Each week, an engineer from the technical team will lead a short, specific demo and then discuss it with attendees. This is the first session in the new series.

Topography is always the baseline for any atomic force microscopy image. It is the baseline for all other advanced techniques and the basis for the imaging technique as a whole. This session will focus on the finer details of controlling tip sample interaction and controls available to an AFM operator to get the most out of their topography images.

Presented By : 
Ben Schoenek, Sr. Technical Service Engineer, Park Systems

Ben Schoenek is a Senior Technical Service Engineer for Park Systems, where he focuses on service and support of AFM systems for Park’s research user base. He received his Master’s in Physics from Auburn University, and holds a B.A. in Physics from Kenyon College.

 

 

 

Live Demo - Park Atomic Force Microscope