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Magnetic force microscopy (MFM) is a Park Systems advanced AFM mode used for studying surfaces with magnetic properties by detecting the interaction between a magnetized cantilever and the sample surface.

 
 
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SmartScan MFM Imaging

Friday, May 1, 2020

  • 3:00 pm
    (EDT)
    Boston, New York
  • 12:00 pm
    (PDT)
    San Francisco, LA
  • 8:00 pm
    (GMT)
    London
  • 9:00 pm
    (CET)
    Paris, Rome

MFM phaseof hard disk
(5µm × 5µm)

Magnetic force microscopy (MFM) is a Park Systems advanced AFM mode used for studying surfaces with magnetic properties by detecting the interaction between a magnetized cantilever and the sample surface. The AFM tip is coated with a layer of magnetic coating to probe the local magnetic field thus maintaining the spatial resolution of AFM. MFM is ideal for detecting the local magnetic properties and the spatial distribution of the samples at the nanoscale. This session will demonstrate how to acquire topographic information and magnetic variations over a sample surface simultaneously by using current NX hardware and software. The basic principle, instrumentation set-up, and data analysis will be covered.

Presented By : 
Jiali Zhang, Ph.D., Technical Support Engineer,
Park Systems

Jiali Zhang, Ph.D., is an engineer for Park Systems, where she focuses on the installation and support of AFM systems for Park’s research user base. She is also responsible for researching and writing technical papers and application notes for publication and presentation at scientific conferences. She received her Ph.D. in Analytical Chemistry from the University of California, Davis, and holds a B.S. in Applied Chemistry from Donghua University in Shanghai, China. Her expertise spans numerous microscopy techniques, and areas of study have also included biological systems and 3D printing technologies.

 

 

 

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