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This session will demonstrate this technique and focus on Approach Retract Scanning (ARS) to image with a pipette using Park Systems AFM.

 
 
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SmartScan SICM Imaging

Friday, May 29, 2020

  • 3:00 pm
    (EDT)
    Boston, New York
  • 12:00 pm
    (PDT)
    San Francisco, LA
  • 8:00 pm
    (GMT)
    London
  • 9:00 pm
    (CET)
    Paris, Rome

SICM ARS Mode

Topography and (b) contrast enhanced topography images of collagen sample imaged in PBS solution with SICM ARS mode. Individual fibril can be clearly identified and the thinnest one observed is about 90nm in width, as pointed by the black arrow. Scan size 10µm×10µm. Image size 256 px× 256 px.

Atomic Force Microscopy (AFM) uses a feedback loop to obtain nanoscale resolution images. This feedback is reliant on keeping a parameter constant. In contact-based imaging this is a constant force and in True Non-Contact™ imaging, an amplitude of a resonance at a given frequency. In Scanning Ion Conductance Microscopy (SICM), the cantilever is replaced with a pipette, filled with ionic fluid and the flow of ions kept constant, which generates a measurable current, allowing another imaging technique using similar principles to AFM. This session will demonstrate this technique and focus on Approach Retract Scanning (ARS) to image with a pipette using Park Systems AFM.

Presented By : 
Presented By : Ben Schoenek, Park Systems Sr. Technical Service Engineer

Ben Schoenek is a Senior Technical Service Engineer for Park Systems, where he focuses on service and support of AFM systems for Park’s research user base. He received his Master’s in Physics from Auburn University, and holds a B.A. in Physics from Kenyon College.

 

 

 

Live Demo - Park Atomic Force Microscope