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Advances in Atomic Force Microscopy: Pushing the LIMITS of Magnetic Force Microscopy

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Magnetic Force Microscopy (MFM) is an Atomic Force Microscopy (AFM) method used for investigating and mapping magnetic properties of surfaces. It is the ideal technique to image the spatial distribution of magnetic states in a sample. In vacuum, MFM offers improved sensitivity and thus allows for high-resolution magnetic domain imaging.

In various fields of study from material research to biological sciences, MFM is an important tool for detecting nanoscale magnetic domains by measuring the interaction force between a magnetic tip and sample.

    • Date: Thursday, October, 1
    • Place: Amphitheatre Room, Laboratoire de Physique des Solides • UMR 8502-Campus universitaire-Bât.510 • F-91405 Orsay Cedex
    • Time: 9:30-17:30

In this workshop you will learn about the latest advances in magnetic force microscopy, such as

      • the newly developed coupled out-of-plane and in-plane magnetic field generator with variable field strengths allowing for maximum flexibility and customized MFM experiments
      • advantages of MFM when measuring in vacuum

The new generation MFM addresses research areas dealing with studies of the magnetic multilayers, ferromagnetic and antiferromagnetic and 2D materials. It also improves the visualization and manipulation of magnetic topological defects, like ferromagnetic domain walls and skyrmions.

The investigation of those materials is crucial for the future application in:

- Data storage and information encoding

- Cryptology

- magnetic recording media

The Workshop is organized by Park Systems France with kind support of the group of Karim Bouzehouane, CNRS Thales.



9:30 Meet & Greet

10:00 Welcome

10:10 “Magnetic Force Microscopy applied to the study of skyrmions in magnetic multilayers,” Dr. Karim Bouzehouane, CNRS Thales

10:50 "Non-Collinear Spin-Texture Analysis: Seeing is Believing?" Prof. Lukas Eng, Technical University Dresden

11:30 Discussion

12:00 Lunch

13:00 Talk, Laboratoire de Physique des Solides, University of Orsay, Paris-Sud

13:40 "Validated quantitative magnetic force microscopy", Sibylle Sievers, PTB Braunschweig

14.20 “On the advantages of high vacuum environments - how vacuum can improve conductive atomic force microscopy?” Ilka Hermes, Principle Scientist, Park Systems Europe

15:00 Coffee Break

15.30 Move to the CNRS Thales, Hivac Laboratory

16.00 – 17.30 AFM in High Vacuum, Hands-on and demonstration on NX-Hivac AFM

18.30 Workshop Dinner


The workshop is FREE OF CHARGE and open to all interested scientist.

Lunch and workshop dinner are included.

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