Nano Academy
23, May 23'
Webinars
Scanning Probe Microscopy (SPM) evolved with the invention of Scanning Tunnelling Microscope (STM). Later, with the development of the Atomic Force Microscope (AFM), topo...
20, Apr 23'
Webinars
今年も新年度・新学期に合わせましてAFM基礎ウェビナーを開催いたします！昨年4月に実施した初級講座をさらに分かりやすい内容にいたしました。これからAFMを使い始める方、普段のオペレーションに自信の無い方、ハードウエア・ソフトウエアのことをもっと知りたい方などなど、基本の形状測定から学んでいただけるチャンスです。
// Marketo l...
30
Nov -0001'
Technical Articles
SSRM AFM for Optimal Results in Semiconductor Failure Analysis
The High Vacuum Scanning Spreading Resistance Microscopy (SSRM), available on Park NX-Hivac, enables 2D ca...
30, Nov -1'
Cell Biology
Live Cell Volume Measurement of SICM
Cell Volume Measurement of Scanning Ion Conductance Microscopy
Myunghoon Choi (Research Product Management of Park Systems, Se...
30, Nov -1'
Technical Articles
Park Systems NX-Hivac allows failure analysis engineers and researchers to improve the sensitivity and resolution of their measurements through scanning spreading resista...
30, Nov -1'
PARK AFM SCHOLARSHIP WINNER
Scholar Interview (December 17, 2020)
Driven by curiosity in materials science and engineering, Alex’s Ph.D. at KU Leuven, in collaboration with the Vrij...
30, Nov -1'
Cell Biology
SICM Image of Suspended Collagen Fibrils
SICM Image of Suspended Collagen Fibrils
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30, Nov -1'
Semiconductor
High Throughput Electrical Measurements with No Sacrifice in Signal Sensitivity
Summary
With the implementation of QuickStep Scan, the throughput of the Scannin...
30, Nov -1'
PARK AFM SCHOLARSHIP WINNER
Christoph Bohr is a PhD student (scholar of the Evonik Foundation) at the University of Cologne, Germany. His current research topic is „Electrospun Perovskite Fi...
30
Nov -0001'
Technical Articles
Research Application Technology Center, Park Systems Corp.
Introduction
Since the invention of atomic force microscopy (AFM) [1], it has found widespread application in...