Live Demo
This session will demonstrate how to image in liquid. A Park NX10 AFM system will be used to explain the hardware setup, basic principle, and data analysis.
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This session will demonstrate how to acquire nanomechanical properties using Park Systems PinPoint™ Mode.
PinPoint™ Nan...
Image size and lateral resolution in Atomic Force Microscope (AFM) images are generally traded off against each other as the AFM records a certain number of pixels per a ...
This session will demonstrate this technique and focus on Approach Retract Scanning (ARS) to image with a pipette using Park Systems AFM.
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Park AFM’s nanolithography is an advanced AFM technique used to pattern nanoscale shapes onto sample surfaces. In the bias-assisted or anodic oxidation method, a bias vol...
Scanning Capacitance Microscopy (SCM) is an advanced imaging mode of Park AFM used to map various doping levels of non-uniformly doped semiconductor samples.
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Magnetic force microscopy (MFM) is a Park Systems advanced AFM mode used for studying surfaces with magnetic properties by detecting the interaction between a magnetized ...
Measuring the electrostatic interaction between the atomic force microscope (AFM) tip and sample is a common technique used to characterize electrically sensitive samples...
Park Systems Weekly Demo & Chat Sessions is a new series of online, live demonstrations of Park AFM Systems hosted by the Park Systems Technical team. Each week, an engin...
In this LIVE DEMO on the NX-Wafer Automated AFM we will introduce you to the inline metrology capabilities which are needed for full-automatic quality control.
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