Park Systems, the preferred nanotechnology solutions partner for the most accurate AFM results, cordially invites you to visit our booth(#1310) at the 2012 American Chemical Society Spring Meeting in San Diego, CA USA (March 25th-27th, 2012). Please, stop by our booth to learn our wide range of research AFM products. We will display the NX10, the world's premium research-grade True Non-Contact AFM, featuring industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. Experience the NX 10 built on Park Systems' 28 years of technology leadership in AFM data accuracy, and its reputation as the leading nanotechnology solutions partner to research and industry. Also, find out more about the XE-150, our premier cross-functional AFM with motorized sample stage, and the XE-Bio, our new AFM for live cell imaging with Ion Conductance Microscopy (ICM). All the NX & XE-series of products feature artifact free imaging by Crosstalk Elimination and non-destructive scan by True Non-Contact mode.
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- Small Sample AFM
- Large Sample AFM
- Vacuum Environment AFM
- AFM Probes and Options
- AFM Modes and Techniques
- 인라인 계측용 원자현미경
- AFM for Wafer Fabs
- AFM for Flat Panel Display
- Photomask Repair
- Optical Profilometry
- Nano Infrared Spectroscopy
- Ellipsometry for Thin Film Characterization
- Imaging Spectroscopic Ellipsometry
- Referenced Spectroscopic Ellipsometry
- Brewster Angle Microscopy
- Ellipsometry Accessories
- Surface Inspection Metrology
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Lectures
- How AFM Works
- 전문가 코너
- Analyze Cells
- Programs
- Park AFM Scholarship
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- 인라인 계측용 원자현미경
- Ellipsometry for Thin Film Characterization
- Active Vibration Isolation
- Software
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Programs
- Resources
- You are here:
- 홈
- 이벤트
- 유저미팅 & 전시회
- 전시회
- ACS Spring 2012
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